A Bayesian Analysis for Accelerated Lifetime Tests Under an Exponential Power Law Model with Threshold Stress

Cynthia Tojeiro, Francisco Louzada-Neto and Heleno Bolfarine

Journal of Applied Statistics, 2004, vol. 31, issue 6, 685-691

Abstract: In this paper, we present a Bayesian methodology for modelling accelerated lifetime tests under a stress response relationship with a threshold stress. Both Laplace and MCMC methods are considered. The methodology is described in detail for the case when an exponential distribution is assumed to express the behaviour of lifetimes, and a power law model with a threshold stress is assumed as the stress response relationship. We assume vague but proper priors for the parameters of interest. The methodology is illustrated by a accelerated failure test on an electrical insulation film.

Keywords: Accelerated Life Tests; Threshold Stress; Bayesian Approach; Mcmc; Laplace Approxiation (search for similar items in EconPapers)
Date: 2004
References: Add references at CitEc
Citations: View citations in EconPapers (1)

Downloads: (external link)
http://www.tandfonline.com/doi/abs/10.1080/1478881042000214668 (text/html)
Access to full text is restricted to subscribers.

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:taf:japsta:v:31:y:2004:i:6:p:685-691

Ordering information: This journal article can be ordered from
http://www.tandfonline.com/pricing/journal/CJAS20

DOI: 10.1080/1478881042000214668

Access Statistics for this article

Journal of Applied Statistics is currently edited by Robert Aykroyd

More articles in Journal of Applied Statistics from Taylor & Francis Journals
Bibliographic data for series maintained by Chris Longhurst ().