A double acceptance sampling plan for generalized log-logistic distributions with known shape parameters

Muhammad Aslam and Chi-Hyuck Jun

Journal of Applied Statistics, 2010, vol. 37, issue 3, 405-414

Abstract: A double acceptance sampling plan for the truncated life test is developed assuming that the lifetime of a product follows a generalized log-logistic distribution with known shape parameters. The zero and one failure scheme is mainly considered, where the lot is accepted if no failures are observed from the first sample and it is rejected if two or more failures occur. When there is one failure from the first sample, the second sample is drawn and tested for the same duration as the first sample. The minimum sample sizes of the first and second samples are determined to ensure that the true median life is longer than the given life at the specified consumer's confidence level. The operating characteristics are analyzed according to various ratios of the true median life to the specified life. The minimum such ratios are also obtained so as to lower the producer's risk at the specified level. The results are explained with examples.

Keywords: consumer's confidence; double acceptance sampling; log-logistic distribution; producer's risk; single acceptance sampling (search for similar items in EconPapers)
Date: 2010
References: View references in EconPapers View complete reference list from CitEc
Citations: View citations in EconPapers (5)

Downloads: (external link)
http://www.tandfonline.com/doi/abs/10.1080/02664760802698979 (text/html)
Access to full text is restricted to subscribers.

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:taf:japsta:v:37:y:2010:i:3:p:405-414

Ordering information: This journal article can be ordered from
http://www.tandfonline.com/pricing/journal/CJAS20

DOI: 10.1080/02664760802698979

Access Statistics for this article

Journal of Applied Statistics is currently edited by Robert Aykroyd

More articles in Journal of Applied Statistics from Taylor & Francis Journals
Bibliographic data for series maintained by Chris Longhurst ().