Robust first-order rotatable lifetime improvement experimental designs

Rabindra Nath Das, Jinseog Kim and Youngjo Lee

Journal of Applied Statistics, 2015, vol. 42, issue 9, 1911-1930

Abstract: Experimental designs are widely used in predicting the optimal operating conditions of the process parameters in lifetime improvement experiments. The most commonly observed lifetime distributions are log-normal, exponential, gamma and Weibull. In the present article, invariant robust first-order rotatable designs are derived for autocorrelated lifetime responses having log-normal, exponential, gamma and Weibull distributions. In the process, robust first-order D -optimal and rotatable conditions have been derived under these situations. For these lifetime distributions with correlated errors, it is shown that robust first-order D -optimal designs are always robust rotatable but the converse is not true. Moreover, it is observed that robust first-order D -optimal and rotatable designs depend on the respective error variance-covariance structure but are independent from these considered lifetime response distributions.

Date: 2015
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DOI: 10.1080/02664763.2015.1014888

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