Component and system burn-in for repairable systems

Kyungmee Kim and Way Kuo

IISE Transactions, 2011, vol. 43, issue 11, 773-782

Abstract: From the system viewpoint there are at least two options to screen out defective components. First, components undergo burn-in for various times before they are placed together in a system, which is called component burn-in. Second, systems face burn-in after being assembled from components, called system burn-in. This article compares these two options for repairable systems. System reliability and rate of occurrence of system failures are used as the criteria for comparisons. To model successive system failures during system burn-in, two common types of repair are considered: component replacement and minimal repair. For each repair type analytical results are obtained that show that both component and system burn-in have a positive impact on the criteria, with component burn-in outperforming system burn-in. These results are obtained under the assumption that each component in a system has a decreasing failure rate distribution.Accepted in 2005 for a special issue on Reliability co-edited by Hoang Pham, Rutgers University; Dong Ho Pak, Hallym University, Korea; and Richard Cassady, University of Arkansas.

Date: 2011
References: Add references at CitEc
Citations:

Downloads: (external link)
http://hdl.handle.net/10.1080/0740817X.2011.590432 (text/html)
Access to full text is restricted to subscribers.

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:taf:uiiexx:v:43:y:2011:i:11:p:773-782

Ordering information: This journal article can be ordered from
http://www.tandfonline.com/pricing/journal/uiie20

DOI: 10.1080/0740817X.2011.590432

Access Statistics for this article

IISE Transactions is currently edited by Jianjun Shi

More articles in IISE Transactions from Taylor & Francis Journals
Bibliographic data for series maintained by Chris Longhurst ().