Degradation modeling and monitoring of machines using operation-specific hidden Markov models
Michael E. Cholette and
Dragan Djurdjanovic
IISE Transactions, 2014, vol. 46, issue 10, 1107-1123
Abstract:
In this article, a novel data-driven approach to monitoring of systems operating under variable operating conditions is described. The method is based on characterizing the degradation process via a set of operation-specific hidden Markov models (HMMs), whose hidden states represent the unobservable degradation states of the monitored system while its observable symbols represent the sensor readings. Using the HMM framework, modeling, identification, and monitoring methods are detailed that allow one to identify an HMM of degradation for each operation from mixed-operation data and perform operation-specific monitoring of the system. Using a large data set provided by a major manufacturer, the new methods are applied to a semiconductor manufacturing process running multiple operations in a production environment.
Date: 2014
References: Add references at CitEc
Citations: View citations in EconPapers (4)
Downloads: (external link)
http://hdl.handle.net/10.1080/0740817X.2014.905734 (text/html)
Access to full text is restricted to subscribers.
Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.
Export reference: BibTeX
RIS (EndNote, ProCite, RefMan)
HTML/Text
Persistent link: https://EconPapers.repec.org/RePEc:taf:uiiexx:v:46:y:2014:i:10:p:1107-1123
Ordering information: This journal article can be ordered from
http://www.tandfonline.com/pricing/journal/uiie20
DOI: 10.1080/0740817X.2014.905734
Access Statistics for this article
IISE Transactions is currently edited by Jianjun Shi
More articles in IISE Transactions from Taylor & Francis Journals
Bibliographic data for series maintained by Chris Longhurst ().