Joint modeling of laboratory and field data with application to warranty prediction for highly reliable products
Sheng-Tsaing Tseng,
Nan-Jung Hsu and
Yi-Chiao Lin
IISE Transactions, 2016, vol. 48, issue 8, 710-719
Abstract:
To achieve a successful warranty management program, a good prediction of a product's field return rate during the warranty period is essential. This study aims to make field return rate predictions for a particular scenario, the one where multiple products have a similar design and discrete-type laboratory data together with continuous-type field data is available for each product. We build a hierarchical model to link the laboratory and field data on failure. The efficient sharing of information among products means that the proposed method generally provides a more stable laboratory summary for each individual product, especially for those cases with few or even no failures during the laboratory testing stage. Furthermore, a real case study is used to verify the proposed method. It is shown that the proposed method provides a better connection between laboratory reliability and field reliability, and this leads to a significant improvement in the estimated field return rate.
Date: 2016
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Persistent link: https://EconPapers.repec.org/RePEc:taf:uiiexx:v:48:y:2016:i:8:p:710-719
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DOI: 10.1080/0740817X.2015.1133941
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