A SIMPLE SOLID-ON-SOLID MODEL OF EPITAXIAL FILM GROWTH: SURFACE MORPHOLOGY ANISOTROPY

K. Malarz () and A. Z. Maksymowicz ()
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K. Malarz: Department of Theoretical and Computational Physics, Faculty of Physics and Nuclear Techniques, University of Mining and Metallurgy (AGH), al. Mickiewicza 30, PL-30059 Kraków, Poland
A. Z. Maksymowicz: Department of Theoretical and Computational Physics, Faculty of Physics and Nuclear Techniques, University of Mining and Metallurgy (AGH), al. Mickiewicza 30, PL-30059 Kraków, Poland

International Journal of Modern Physics C (IJMPC), 1999, vol. 10, issue 04, 659-665

Abstract: In this paper we present a generalization of a simple solid-on-solid epitaxial model of thin film growth, when surface morphology anisotropy is provoked by anisotropy in the model control parameters of binding energy and/or diffusion barrier. The anisotropy is discussed in terms of the height–height correlation function. It was experimentally confirmed that the difference in diffusion barriers yields anisotropy in morphology of the surface. We obtained antisymmetric correlations in the two in-plane directions for antisymmetric binding.

Keywords: Surface structure; Morphology; Roughness; Topography; Surface diffusion; Computer simulations; Monte Carlo methods (search for similar items in EconPapers)
Date: 1999
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DOI: 10.1142/S0129183199000498

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