FAULT-TOLERANT NANOCOMPUTERS BASED ON ASYNCHRONOUS CELLULAR AUTOMATA
Teijiro Isokawa (),
Fukutaro Abo (),
Ferdinand Peper (),
Susumu Adachi (),
Jia Lee (),
Nobuyuki Matsui () and
Shinro Mashiko ()
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Teijiro Isokawa: Division of Computer Engineering, Himeji Institute of Technology, University of Hyogo, 2167 Shosha, Himeji, Hyogo, 671-2201, Japan
Fukutaro Abo: Division of Computer Engineering, Himeji Institute of Technology, University of Hyogo, 2167 Shosha, Himeji, Hyogo, 671-2201, Japan
Ferdinand Peper: Nanotechnology Group, National Institute of Information and Communications Technology, 588-2 Iwaoka, Iwaoka-cho, Nishi-ku, Kobe, 651-2492, Japan;
Susumu Adachi: Nanotechnology Group, National Institute of Information and Communications Technology, 588-2 Iwaoka, Iwaoka-cho, Nishi-ku, Kobe, 651-2492, Japan
Jia Lee: Nanotechnology Group, National Institute of Information and Communications Technology, 588-2 Iwaoka, Iwaoka-cho, Nishi-ku, Kobe, 651-2492, Japan
Nobuyuki Matsui: Division of Computer Engineering, Himeji Institute of Technology, University of Hyogo, 2167 Shosha, Himeji, Hyogo, 671-2201, Japan
Shinro Mashiko: Nanotechnology Group, National Institute of Information and Communications Technology, 588-2 Iwaoka, Iwaoka-cho, Nishi-ku, Kobe, 651-2492, Japan
International Journal of Modern Physics C (IJMPC), 2004, vol. 15, issue 06, 893-915
Abstract:
Cellular Automata (CA) are a promising architecture for computers with nanometer-scale sized components, because their regular structure potentially allows chemical manufacturing techniques based on self-organization. With the increase in integration density, however, comes a decrease in the reliability of the components from which such computers will be built. This paper employs BCH error-correcting codes to construct CA with improved reliability. We construct an asynchronous CA of which a quarter of the (ternary) bits storing a cell's state information may be corrupted without affecting the CA's operations, provided errors are evenly distributed over a cell's bits (no burst errors allowed). Under the same condition, the corruption of half of a cell's bits can be detected.
Keywords: Asynchronous cellular automata; fault-tolerance; error-correcting code; nanotechnology (search for similar items in EconPapers)
Date: 2004
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Persistent link: https://EconPapers.repec.org/RePEc:wsi:ijmpcx:v:15:y:2004:i:06:n:s0129183104006327
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DOI: 10.1142/S0129183104006327
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