EVALUATION OF SKIN AGEING THROUGH WRINKLE ANALYSIS IN CAPACITIVE IMAGES
Alessandro Bevilacqua (),
Alessandro Gherardi () and
Roberto Guerrieri ()
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Alessandro Bevilacqua: ARCES (Advanced Research Center on Electronic Systems) – University of Bologna, via Toffano 2/2, 40125 Bologna, Italy
Alessandro Gherardi: ARCES (Advanced Research Center on Electronic Systems) – University of Bologna, via Toffano 2/2, 40125 Bologna, Italy
Roberto Guerrieri: ARCES (Advanced Research Center on Electronic Systems) – University of Bologna, via Toffano 2/2, 40125 Bologna, Italy
International Journal of Modern Physics C (IJMPC), 2006, vol. 17, issue 11, 1663-1678
Abstract:
Quantitative evaluation of the changes in skin topographic structures are of great importance in the dermocosmetic field to assess subjects response to medical or cosmetic treatments. Although many devices and methods are known to measure these changes, they are not suitable for a routine approach and most of them are invasive. Moreover, it has always been difficult to give a measure of the skin health status as well as of the human aging process by simply analyzing the skin surface appearance. This work describes how a portable capacitive device could be utilized to achieve measurements of skin ageing in vivo and routinely. The capacitive images give a high resolution representation of the skin micro-relief, both in terms of skin surface tissue and wrinkles. In a previous work we dealt with the former; here we have addressed the latter. The algorithm we have developed allowed us to extract two original features from wrinkles: the first is based on photometric properties while the second has been achieved through the multiresolution analysis of the wavelet transform. Accurate experiments accomplished on 87 subjects show how the features we conceived are related to skin ageing.
Keywords: Image analysis; wavelet; medical imaging; skin ageing; skin surface analysis; capacitive device (search for similar items in EconPapers)
Date: 2006
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Persistent link: https://EconPapers.repec.org/RePEc:wsi:ijmpcx:v:17:y:2006:i:11:n:s0129183106009990
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DOI: 10.1142/S0129183106009990
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