Two-dimensional DFA scaling analysis applied to encrypted images

C. Vargas-Olmos (), J. S. Murguía (), M. T. Ramírez-Torres (), M. Mejía Carlos (), H. C. Rosu () and H. González-Aguilar ()
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C. Vargas-Olmos: Facultad de Ciencias, Universidad Autónoma de San Luis Potosí (UASLP), Instituto de Investigación en Comunicación Óptica, Álvaro Obregón 64, 78000 San Luis Potosí, S.L.P., México
J. S. Murguía: Facultad de Ciencias, Universidad Autónoma de San Luis Potosí, Álvaro Obregón 64, 78000 San Luis Potosí, S.L.P., México
M. T. Ramírez-Torres: Instituto de Investigación en Comunicación Óptica, UASLP, Álvaro Obregón 64, 78000 San Luis Potosí, S.L.P., México
M. Mejía Carlos: Instituto de Investigación en Comunicación Óptica, UASLP, Álvaro Obregón 64, 78000 San Luis Potosí, S.L.P., México
H. C. Rosu: IPICyT, Instituto Potosino de Investigacion Cientifica y Tecnologica, Apartado Postal 3-74 Tangamanga, 78231 San Luis Potosí, México
H. González-Aguilar: Facultad de Ciencias, Universidad Autónoma de San Luis Potosí, Álvaro Obregón 64, 78000 San Luis Potosí, S.L.P., México

International Journal of Modern Physics C (IJMPC), 2015, vol. 26, issue 08, 1-12

Abstract: The technique of detrended fluctuation analysis (DFA) has been widely used to unveil scaling properties of many different signals. In this paper, we determine scaling properties in the encrypted images by means of a two-dimensional DFA approach. To carry out the image encryption, we use an enhanced cryptosystem based on a rule-90 cellular automaton and we compare the results obtained with its unmodified version and the encryption system AES. The numerical results show that the encrypted images present a persistent behavior which is close to that of the1/f-noise. These results point to the possibility that the DFA scaling exponent can be used to measure the quality of the encrypted image content.

Keywords: Encryption system; two-dimensional DFA; scaling laws; 05.40.-a; 05.45.-a; 05.45.Df; 05.45.Tp (search for similar items in EconPapers)
Date: 2015
References: View complete reference list from CitEc
Citations: View citations in EconPapers (1)

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DOI: 10.1142/S012918311550093X

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