Frontiers in Statistical Quality Control 8

Edited by Hans-Joachim Lenz () and Peter-Theodor Wilrich ()

in Springer Books from Springer

Date: 2006
ISBN: 978-3-7908-1687-7
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Chapters in this book:

How Some ISO Standards Complicate Quality Improvement

Elart von Collani and Prank A. Palcat

Optimal Two-Stage Sequential Sampling Plans by Attributes

Olgierd Hryniewicz

Three-Class Sampling Plans: A Review with Applications

Frank A. Palcat

CUSUM Control Schemes for Multivariate Time Series

Olha Bodnar and Wolfgang Schmid

The Art of Evaluating Monitoring Schemes — How to Measure the Performance of Control Charts?

Sven Knoth

Misleading Signals in Joint Schemes for μ and σ

Manuel Cabral Morais and António Pacheco

The Fréchet Control Charts

Edyta Mrówka and Przemysław Grzegorzewski

Reconsidering Control Charts in Japan

Ken Nishina, Kazuyoshi Kuzuya and Naru Ishii

Control Charts for the Number of Children Injured in Traffic Accidents

F. Pokropp, W. Seidel, A. Begun, M. Heidenreich and K. Sever

A New Perspective on the Fundamental Concept of Rational Subgroups

Marion R. Reynolds and Zachary G. Stoumbos

Economic Advantages of CUSUM Control Charts for Variables

Erwin M. Saniga, Thomas P. McWilliams, Darwin J. Davis and James M. Lucas

Choice of Control Interval for Controlling Assembly Processes

Tomomichi Suzuki, Taku Harada and Yoshikazu Ojima

Generalization of the Run Rules for the Shewhart Control Charts

Seiichi Yasui, Yoshikazu Ojima and Tomomichi Suzuki

Robust On-Line Turning Point Detection. The Influence of Turning Point Characteristics

E. Andersson

Specification Setting for Drugs in the Pharmaceutical Industry

Jørgen Iwersen and Henrik Melgaard

Monitoring a Sequencing Batch Reactor for the Treatment of Wastewater by a Combination of Multivariate Statistical Process Control and a Classification Technique

Magda Ruiz, Joan Colomer and Joaquim Melendez

Data Mining and Statistical Control - A Review and Some Links

Rainer Göb

Optimal Process Calibration under Nonsymmetric Loss Function

Przemysław Grzegorzewski and Edyta Mrówka

The Probability of the Occurrence of Negative Estimates in the Variance Components Estimation by Nested Precision Experiments

Yoshikazu Ojima, Seiichi Yasui, Feng Ling, Tomomichi Suzuki and Taku Harada

Statistical Methods Applied to a Semiconductor Manufacturing Process

Takeshi Koyama

An Overview of Composite Designs Run as Split-Plots

Geoff Vining and Scott Kowalski

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DOI: 10.1007/3-7908-1687-6

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