Special Topics in Metrology

Stephen Crowder, Collin Delker, Eric Forrest and Nevin Martin ()
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Stephen Crowder: Sandia National Laboratories
Collin Delker: Sandia National Laboratories
Eric Forrest: Sandia National Laboratories
Nevin Martin: Sandia National Laboratories

Chapter Chapter 11 in Introduction to Statistics in Metrology, 2020, pp 267-302 from Springer

Abstract: Abstract Metrology guides such as the JCGM 100 and JCGM 101 present in detail the most commonly used methods for evaluating measurement uncertainty. Additional guides for less commonly used methods are in development. In this chapter we present an overview of methods that we find valuable and deserving of more coverage. These methods include statistical process control (SPC), binary measurement systems (BMS), destructive measurements, sample size determination, and Bayesian analysis in metrology.

Date: 2020
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DOI: 10.1007/978-3-030-53329-8_11

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