Introduction to Statistics in Metrology

Stephen Crowder (), Collin Delker (), Eric Forrest () and Nevin Martin ()
Additional contact information
Stephen Crowder: Sandia National Laboratories
Collin Delker: Sandia National Laboratories
Eric Forrest: Sandia National Laboratories
Nevin Martin: Sandia National Laboratories

in Springer Books from Springer

Date: 2020
ISBN: 978-3-030-53329-8
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Chapters in this book:

Ch Chapter 1 Introduction

Stephen Crowder, Collin Delker, Eric Forrest and Nevin Martin

Ch Chapter 10 Determining Uncertainties in Fitted Curves

Stephen Crowder, Collin Delker, Eric Forrest and Nevin Martin

Ch Chapter 11 Special Topics in Metrology

Stephen Crowder, Collin Delker, Eric Forrest and Nevin Martin

Ch Chapter 2 Basic Measurement Concepts

Stephen Crowder, Collin Delker, Eric Forrest and Nevin Martin

Ch Chapter 3 The International System of Units, Traceability, and Calibration

Stephen Crowder, Collin Delker, Eric Forrest and Nevin Martin

Ch Chapter 4 Introduction to Statistics and Probability

Stephen Crowder, Collin Delker, Eric Forrest and Nevin Martin

Ch Chapter 5 Measurement Uncertainty in Decision Making

Stephen Crowder, Collin Delker, Eric Forrest and Nevin Martin

Ch Chapter 6 The Measurement Model and Uncertainty

Stephen Crowder, Collin Delker, Eric Forrest and Nevin Martin

Ch Chapter 7 Analytical Methods for the Propagation of Uncertainties

Stephen Crowder, Collin Delker, Eric Forrest and Nevin Martin

Ch Chapter 8 Monte Carlo Methods for the Propagation of Uncertainties

Stephen Crowder, Collin Delker, Eric Forrest and Nevin Martin

Ch Chapter 9 Design of Experiments in Metrology

Stephen Crowder, Collin Delker, Eric Forrest and Nevin Martin

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DOI: 10.1007/978-3-030-53329-8

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