Introduction to Statistics and Probability

Stephen Crowder, Collin Delker, Eric Forrest and Nevin Martin ()
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Stephen Crowder: Sandia National Laboratories
Collin Delker: Sandia National Laboratories
Eric Forrest: Sandia National Laboratories
Nevin Martin: Sandia National Laboratories

Chapter Chapter 4 in Introduction to Statistics in Metrology, 2020, pp 59-80 from Springer

Abstract: Abstract This chapter provides an overview of statistics and probability concepts that are used in metrology. It begins with a discussion on data types along with Exploratory Data Analysis techniques that can be used to help understand and visualize data. It then gives an overview of probability distributions common to metrology with guidance on choosing probability distributions based on available information. This chapter concludes with information on estimating parameters and assessing goodness-of-fit of probability models.

Date: 2020
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Persistent link: https://EconPapers.repec.org/RePEc:spr:sprchp:978-3-030-53329-8_4

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DOI: 10.1007/978-3-030-53329-8_4

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