Basic Measurement Concepts

Stephen Crowder, Collin Delker, Eric Forrest and Nevin Martin ()
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Stephen Crowder: Sandia National Laboratories
Collin Delker: Sandia National Laboratories
Eric Forrest: Sandia National Laboratories
Nevin Martin: Sandia National Laboratories

Chapter Chapter 2 in Introduction to Statistics in Metrology, 2020, pp 19-39 from Springer

Abstract: Abstract Consistent and understandable terminology is essential in metrology. Uniform terminology facilitates comparison of results and uncertainties between metrology organizations and measurement practitioners. Despite the importance of correct terminology, misinterpretation of common terminology still abounds in scientific, engineering, and academic communities. This chapter covers basic measurement terminology and concepts that are necessary to proper understanding of measurement data and associated uncertainties. The difference between accuracy, precision, resolution, repeatability, reproducibility, uncertainty, and other terms are discussed. The International Vocabulary of Metrology (referred to as “the VIM”), fundamentally a dictionary of metrology terms, serves as the basis for common terminology.

Date: 2020
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DOI: 10.1007/978-3-030-53329-8_2

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