Goodness-of-Fit Tests for Reliability Modeling

Alex Karagrigoriou ()

Chapter Chapter 18 in Recent Advances in System Reliability, 2012, pp 253-267 from Springer

Abstract: Abstract In this work we provide goodness-of-fit (GoF) tests which are based on measures of divergence and can be used for assessing the appropriateness of both discrete and continuous distributions. The main focus is on continuous distributions like the exponential, Weibull, Inverse Gaussian, Gamma and lognormal which frequently appear in engineering and reliability. An extensive simulation study shows that the new tests maintain good stability in level and high power across a wider range of distributions and sample sizes than other tests.

Keywords: Generalized goodness-of-fit tests; Measures of divergence; Lifetime distribution; Multinomial populations (search for similar items in EconPapers)
Date: 2012
References: Add references at CitEc
Citations:

There are no downloads for this item, see the EconPapers FAQ for hints about obtaining it.

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:spr:ssrchp:978-1-4471-2207-4_18

Ordering information: This item can be ordered from
http://www.springer.com/9781447122074

DOI: 10.1007/978-1-4471-2207-4_18

Access Statistics for this chapter

More chapters in Springer Series in Reliability Engineering from Springer
Bibliographic data for series maintained by Sonal Shukla () and Springer Nature Abstracting and Indexing ().