Springer Series in Reliability Engineering
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- Safety and Security of Domino Effects in the Process Industry: The State of the Art
- Chao Chen, Genserik Reniers and Ming Yang
- Importance and Characteristics of Gas Leakage and Jet Fire
- Kuibin Zhou
- Basic Concepts of Reliability
- Chao Hu, Byeng D. Youn and Pingfeng Wang
- Maintenance of Buildings and Components
- Cláudia Ferreira, Ana Silva, Jorge de Brito and Inês Flores-Colen
- Deterministic Theorem on Fatigue and Fracture
- J. J. Xiong and R. A. Shenoi
- Open Source Software Reliability
- Yoshinobu Tamura and Shigeru Yamada
- Introduction
- Taeho Woo
- Introduction
- P. K. Kapur, H. Pham, A. Gupta and P. C. Jha
- Time Varying Communication Networks: Modelling, Reliability Evaluation and Optimization
- Gaurav Khanna, S. K. Chaturvedi and Sieteng Soh
- Influences of Electronic Materials Properties on Packaging Reliability
- Chong Leong Gan and Chen Yu Huang
- Forecasting The Long-Term Growth of S&P 500 Index
- Stephen H.-T. Lihn
- Enhancing Dysarthric Speech for Improved Clinical Communication: A Deep Learning Approach
- A. P. Yeshwanth Balaji, T. R. Eshwanth Karti, K. Nithish Ariyha, J. Vikash and G. Jyothish Lal
- Signature Representation and Preservation Results for Engineered Systems and Applications to Statistical Inference
- N. Balakrishnan, Jorge Navarro and Francisco J. Samaniego
- Erratum to: Model Checking After Bayesian Inference
- Matteo Pozzi and Daniele Zonta
- Introduction
- Maxim Finkelstein and Ji Hwan Cha
- Introduction
- Ji Hwan Cha and Maxim Finkelstein
- Introduction
- Ajit Kumar Verma, Srividya Ajit and Manoj Kumar
- Introduction
- Prabhakar V. Varde and Michael G. Pecht
- Software Reliability
- Shigeru Yamada and Yoshinobu Tamura
- Modeling Reliability and Safety of Multistate Systems with Ageing Components
- Krzysztof Kołowrocki and Joanna Soszyńska-Budny
- A Game Theory-Based Hybrid Medium Access Control Protocol for Congestion Control in Wireless Sensor Networks
- Raja Periyasamy and Dananjayan Perumal
- Introduction
- D.N.P. Murthy and Nat Jack
- Advanced Memory and Device Packaging
- Gan Chong Leong and Huang Chen-Yu
- Dynamic Availability Analysis for the Flexible Manufacturing System Based on a Two-Step Stochastic Model
- Wenbin Zeng, Guixiang Shen, Ilia Frenkel, Igor Bolvashenkov, Jörg Kammermann, Hans-Georg Herzog, Lev Khvatskin and Anatoly Lisnianski
- Introduction
- Sylwia Werbińska-Wojciechowska
- ATEX—Introduction
- Torben Jespen
- Introduction
- Torben Jespen
- Introduction
- Cher Ming Tan, Zhenghao Gan, Wei Li and Yuejin Hou
- Introduction
- Satoshi Mizutani, Xufeng Zhao and Toshio Nakagawa
- Introduction
- Enrico Zio
- Introduction
- Toshio Nakagawa
- Introduction
- Gilberto Francisco Martha Souza
- Introduction: the Global Risk Arena, Technological Systems and This Book
- Per Jacobsson, Göran Grimvall, Åke J. Holmgren and Torbjörn Thedéen
- Introduction
- Izuru Takewaki, Abbas Moustafa and Kohei Fujita
- Introduction and Motivation
- Dana Kelly and Curtis Smith
- Scope and Methodology of Research into Digital Safety Management Mechanisms as a Social Element of the Business Models of Railway Enterprises
- Adam Jabłoński and Marek Jabłoński
- Introduction to Control Charts and Machine Learning for Anomaly Detection in Manufacturing
- Kim Phuc Tran
- Introduction to Smart Manufacturing with Artificial Intelligence
- Kim Phuc Tran
- Introduction to Artificial Intelligence for Safety and Reliability Engineering
- Kim Phuc Tran
- Basic Probability, Statistics, and Reliability
- Hoang Pham
- Introduction
- Yu Liu, Hong-Zhong Huang and Tao Jiang
- Software Reliability Modeling and Methods: A State of the Art Review
- Mengmeng Zhu and Hoang Pham
- Recurrent Integrated CNN Gate (RICG): A Dynamic Deep Learning Model for Security and Efficiency Enhancement in Cyber-Physical Systems
- G. Ramesh, Geeta C. Mara, S. Sridhar, D. N. Pughazendi and N. Thillaiarasu
- Introduction
- Asbjørn Rolstadås, Per Willy Hetland, George Farage Jergeas and Richard E. Westney
- Introduction
- Cao Wang
- Introduction
- Hoang Pham
- Introduction
- Mircea Grigoriu
- An Overview
- Wallace R. Blischke, M. Rezaul Karim and D. N. Prabhakar Murthy
- Introduction
- Xufeng Zhao and Toshio Nakagawa
- Introduction to the Necessity of Design Methodology
- Seongwoo Woo
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