Springer Series in Reliability Engineering
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- Deep Learning Approach Based on Fault Correction Time for Reliability Assessment of Cloud and Edge Open Source Software
- Hironobu Sone, Shoichiro Miyamoto, Yukinobu Kashihara, Yoshinobu Tamura and Shigeru Yamada
- Introduction
- Hongyan Dui and Shaomin Wu
- Introduction
- Ajit Kumar Verma, Srividya Ajit and Durga Rao Karanki
- Comparison of OSS Reliability Assessment Methods by Using Wiener Data Preprocessing Based on Deep Learning
- Yoshinobu Tamura, Shoichiro Miyamoto, Lei Zhou and Shigeru Yamada
- Introduction
- Toshio Nakagawa
- Introduction
- Kodo Ito and Toshio Nakagawa
- A Game Theory-Based Hybrid Medium Access Control Protocol for Congestion Control in Wireless Sensor Networks
- Raja Periyasamy and Dananjayan Perumal
- Introduction
- Asbjørn Rolstadås, Per Willy Hetland, George Farage Jergeas and Richard E. Westney
- Introduction
- Cao Wang
- Introduction
- Mircea Grigoriu
- Introduction
- Hoang Pham
- Introduction
- Ji Hwan Cha and Maxim Finkelstein
- Introduction
- Maxim Finkelstein and Ji Hwan Cha
- Enhancing Dysarthric Speech for Improved Clinical Communication: A Deep Learning Approach
- A. P. Yeshwanth Balaji, T. R. Eshwanth Karti, K. Nithish Ariyha, J. Vikash and G. Jyothish Lal
- Signature Representation and Preservation Results for Engineered Systems and Applications to Statistical Inference
- N. Balakrishnan, Jorge Navarro and Francisco J. Samaniego
- Introduction to Human-Centered Explainable Anomaly Detection for Smart Manufacturing in Industry 5.0
- Kim Phuc Tran
- Introduction to Artificial Intelligence for Safety and Reliability Engineering
- Kim Phuc Tran
- Introduction to Smart Manufacturing with Artificial Intelligence
- Kim Phuc Tran
- An Overview
- Wallace R. Blischke, M. Rezaul Karim and D. N. Prabhakar Murthy
- Introduction
- Xufeng Zhao and Toshio Nakagawa
- Introduction
- Ajit Kumar Verma, Srividya Ajit and Manoj Kumar
- Software Reliability
- Shigeru Yamada and Yoshinobu Tamura
- Introduction
- Prabhakar V. Varde and Michael G. Pecht
- Modeling Reliability and Safety of Multistate Systems with Ageing Components
- Krzysztof Kołowrocki and Joanna Soszyńska-Budny
- Introduction
- P. K. Kapur, H. Pham, A. Gupta and P. C. Jha
- Finite Element Analysis of Space Frame Structures
- Halil Karadeniz, Mehmet Polat Saka and Vedat Togan
- Erratum to: Model Checking After Bayesian Inference
- Matteo Pozzi and Daniele Zonta
- Introduction
- Torben Jespen
- Introduction
- Cher Ming Tan, Zhenghao Gan, Wei Li and Yuejin Hou
- ATEX—Introduction
- Torben Jespen
- Engineering Decisions for Long-Term Performance of Systems
- Mauricio Sánchez-Silva and Georgia-Ann Klutke
- Forecasting The Long-Term Growth of S&P 500 Index
- Stephen H.-T. Lihn
- Influences of Electronic Materials Properties on Packaging Reliability
- Chong Leong Gan and Chen Yu Huang
- Introduction
- Tarannom Parhizkar, Ingrid B. Utne and Jan-Erik Vinnem
- Introduction to Computational Mathematics in Industrial Systems
- Mohammad Yazdi
- Fatigue Life Distribution Estimation
- D. Gary Harlow
- Generalized Logit-Based Proportional Hazards Models and Their Applications in Survival and Reliability Analyses
- N. Balakrishnan, M. C. Pardo and M. L. Avendaño
- Generic Model of Multi-state System. Reliability, Availability and Performability in Dynamic Modes
- Anatoly Lisnianski, Ilia Frenkel and Lev Khvatskin
- Time Varying Communication Networks: Modelling, Reliability Evaluation and Optimization
- Gaurav Khanna, S. K. Chaturvedi and Sieteng Soh
- Basic Probability, Statistics, and Reliability
- Hoang Pham
- Safety and Security of Domino Effects in the Process Industry: The State of the Art
- Chao Chen, Genserik Reniers and Ming Yang
- Congestion Management in Motorways and Urban Networks Through a Bargaining-Game-Based Coordination Mechanism
- Felipe Valencia, José D. López, Alfredo Núñez, Christian Portilla, Luis G. Cortes, Jairo Espinosa and Bart De Schutter
- Dynamic Availability Analysis for the Flexible Manufacturing System Based on a Two-Step Stochastic Model
- Wenbin Zeng, Guixiang Shen, Ilia Frenkel, Igor Bolvashenkov, Jörg Kammermann, Hans-Georg Herzog, Lev Khvatskin and Anatoly Lisnianski
- Introduction
- D.N.P. Murthy and Nat Jack
- Advanced Memory and Device Packaging
- Gan Chong Leong and Huang Chen-Yu
- Introduction
- Sylwia Werbińska-Wojciechowska
- Introduction and Concepts
- Fuqing Yuan
- Open Source Software Reliability
- Yoshinobu Tamura and Shigeru Yamada
- Introduction
- Taeho Woo
- Introduction to the Necessity of Design Methodology
- Seongwoo Woo
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