Springer Series in Reliability Engineering
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- Introduction
- Maxim Finkelstein and Ji Hwan Cha
- Introduction
- P. K. Kapur, H. Pham, A. Gupta and P. C. Jha
- Introduction
- Izuru Takewaki, Abbas Moustafa and Kohei Fujita
- Introduction: the Global Risk Arena, Technological Systems and This Book
- Per Jacobsson, Göran Grimvall, Åke J. Holmgren and Torbjörn Thedéen
- Scope and Methodology of Research into Digital Safety Management Mechanisms as a Social Element of the Business Models of Railway Enterprises
- Adam Jabłoński and Marek Jabłoński
- Introduction
- Gilberto Francisco Martha Souza
- Introduction
- Satoshi Mizutani, Xufeng Zhao and Toshio Nakagawa
- Introduction to Control Charts and Machine Learning for Anomaly Detection in Manufacturing
- Kim Phuc Tran
- Introduction
- Toshio Nakagawa
- Introduction and Motivation
- Dana Kelly and Curtis Smith
- Introduction
- Enrico Zio
- Introduction
- D.N.P. Murthy and Nat Jack
- Advanced Memory and Device Packaging
- Gan Chong Leong and Huang Chen-Yu
- Dynamic Availability Analysis for the Flexible Manufacturing System Based on a Two-Step Stochastic Model
- Wenbin Zeng, Guixiang Shen, Ilia Frenkel, Igor Bolvashenkov, Jörg Kammermann, Hans-Georg Herzog, Lev Khvatskin and Anatoly Lisnianski
- Introduction
- Sylwia Werbińska-Wojciechowska
- Modeling Reliability and Safety of Multistate Systems with Ageing Components
- Krzysztof Kołowrocki and Joanna Soszyńska-Budny
- Basic Concepts of Reliability
- Chao Hu, Byeng D. Youn and Pingfeng Wang
- Importance and Characteristics of Gas Leakage and Jet Fire
- Kuibin Zhou
- Maintenance of Buildings and Components
- Cláudia Ferreira, Ana Silva, Jorge de Brito and Inês Flores-Colen
- Basic Probability, Statistics, and Reliability
- Hoang Pham
- Introduction
- Jan-Erik Vinnem and Willy Røed
- Risk and Reliability Analysis
- Paolo Gardoni
- Reliability of Electronic Components
- Jong Gyun Choi and Poong Hyun Seong
- Introduction
- Jan-Erik Vinnem
- Central Limit Theorem for a Family of Reliability Measures
- P. Zeephongsekul
- Reliability Estimation by Advanced Monte Carlo Simulation
- Enrico Zio and Nicola Pedroni
- Reliability of a Network with Heterogeneous Components
- Ilya B. Gertsbakh, Yoseph Shpungin and Radislav Vaisman
- An Overview
- K. A. H. Kobbacy and D. N. P. Murthy
- Reliability Expression of Three-Dimensional Consecutive-k Systems
- Tomoaki Akiba, Taishin Nakamura and Hisashi Yamamoto
- Multi-criteria Based Selection of Ship-Based Ballast Water Treatment Technologies
- Eugene Pam, Alan Wall, Zaili Yang, Eddie Blanco-Davis and Jin Wang
- Product Assurance
- Dimitris N. Chorafas
- Advances in Data-Driven RUL Prognosis Techniques
- Xiao-Sheng Si, Zheng-Xin Zhang and Chang-Hua Hu
- Introduction: The Basics of Failure
- T. Tinga
- A Background on Utilities and Maintenance Management
- Juan F. Gómez Fernández and Adolfo Crespo Márquez
- A Multicriteria Multistep Approach for Evaluating Supplier Quality in Large Data Sets
- Aqeel Al Salem, Anjali Awasthi and Chun Wang
- Phase Type and Matrix Exponential Distributions in Stochastic Modeling
- Andras Horvath, Marco Scarpa and Miklos Telek
- ICAO and the Aviation Authorities
- David Lapesa Barrera
- Overview
- Renyan Jiang
- A Game of the Newsvendor Problem Between a Retailer and Customers Under the Space-Time Hotelling Model
- Hiroaki Sandoh
- DC and AC Contingency Solvers in Composite Power System Adequacy Assessment
- Øystein Stake Laengen and Vijay Venu Vadlamudi
- Methodology for Quantified Risk Assessment
- Jan-Erik Vinnem and Willy Røed
- A Survey of Replacement Models with Minimal Repair
- Mohamed-Salah Ouali, Lotfi Tadj, Soumaya Yacout and Daoud Ait-Kadi
- Modelling of the Dynamic Train-Track-Substructure Interaction for Track Monitoring
- Elias Kassa and Xiaopei Cai
- Introduction: Software Dependability
- Long Wang
- Introduction
- Jean-Pierre Signoret and Alain Leroy
- Benefits of Digital Transformation for Maintenance Management Systems. Market Trends
- Adolfo Crespo Márquez
- Introduction
- Srinivasan Gopalakrishnan, Massimo Ruzzene and Sathyanarayana Hanagud
- Reliability Modelling of Complex Systems
- Krzysztof Kołowrocki
- Lifetime Data
- M. Luz Gámiz, K. B. Kulasekera, Nikolaos Limnios and Bo Henry Lindqvist
- Development of Physics-Based Modeling for ULSI Interconnections Failure Mechanisms: Electromigration and Stress-Induced Voiding
- Cher Ming Tan, Zhenghao Gan, Wei Li and Yuejin Hou
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