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Springer Series in Reliability Engineering

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Introduction
Maxim Finkelstein and Ji Hwan Cha
Introduction
P. K. Kapur, H. Pham, A. Gupta and P. C. Jha
Introduction
Izuru Takewaki, Abbas Moustafa and Kohei Fujita
Introduction: the Global Risk Arena, Technological Systems and This Book
Per Jacobsson, Göran Grimvall, Åke J. Holmgren and Torbjörn Thedéen
Scope and Methodology of Research into Digital Safety Management Mechanisms as a Social Element of the Business Models of Railway Enterprises
Adam Jabłoński and Marek Jabłoński
Introduction
Gilberto Francisco Martha Souza
Introduction
Satoshi Mizutani, Xufeng Zhao and Toshio Nakagawa
Introduction to Control Charts and Machine Learning for Anomaly Detection in Manufacturing
Kim Phuc Tran
Introduction
Toshio Nakagawa
Introduction and Motivation
Dana Kelly and Curtis Smith
Introduction
Enrico Zio
Introduction
D.N.P. Murthy and Nat Jack
Advanced Memory and Device Packaging
Gan Chong Leong and Huang Chen-Yu
Dynamic Availability Analysis for the Flexible Manufacturing System Based on a Two-Step Stochastic Model
Wenbin Zeng, Guixiang Shen, Ilia Frenkel, Igor Bolvashenkov, Jörg Kammermann, Hans-Georg Herzog, Lev Khvatskin and Anatoly Lisnianski
Introduction
Sylwia Werbińska-Wojciechowska
Modeling Reliability and Safety of Multistate Systems with Ageing Components
Krzysztof Kołowrocki and Joanna Soszyńska-Budny
Basic Concepts of Reliability
Chao Hu, Byeng D. Youn and Pingfeng Wang
Importance and Characteristics of Gas Leakage and Jet Fire
Kuibin Zhou
Maintenance of Buildings and Components
Cláudia Ferreira, Ana Silva, Jorge de Brito and Inês Flores-Colen
Basic Probability, Statistics, and Reliability
Hoang Pham
Introduction
Jan-Erik Vinnem and Willy Røed
Risk and Reliability Analysis
Paolo Gardoni
Reliability of Electronic Components
Jong Gyun Choi and Poong Hyun Seong
Introduction
Jan-Erik Vinnem
Central Limit Theorem for a Family of Reliability Measures
P. Zeephongsekul
Reliability Estimation by Advanced Monte Carlo Simulation
Enrico Zio and Nicola Pedroni
Reliability of a Network with Heterogeneous Components
Ilya B. Gertsbakh, Yoseph Shpungin and Radislav Vaisman
An Overview
K. A. H. Kobbacy and D. N. P. Murthy
Reliability Expression of Three-Dimensional Consecutive-k Systems
Tomoaki Akiba, Taishin Nakamura and Hisashi Yamamoto
Multi-criteria Based Selection of Ship-Based Ballast Water Treatment Technologies
Eugene Pam, Alan Wall, Zaili Yang, Eddie Blanco-Davis and Jin Wang
Product Assurance
Dimitris N. Chorafas
Advances in Data-Driven RUL Prognosis Techniques
Xiao-Sheng Si, Zheng-Xin Zhang and Chang-Hua Hu
Introduction: The Basics of Failure
T. Tinga
A Background on Utilities and Maintenance Management
Juan F. Gómez Fernández and Adolfo Crespo Márquez
A Multicriteria Multistep Approach for Evaluating Supplier Quality in Large Data Sets
Aqeel Al Salem, Anjali Awasthi and Chun Wang
Phase Type and Matrix Exponential Distributions in Stochastic Modeling
Andras Horvath, Marco Scarpa and Miklos Telek
ICAO and the Aviation Authorities
David Lapesa Barrera
Overview
Renyan Jiang
A Game of the Newsvendor Problem Between a Retailer and Customers Under the Space-Time Hotelling Model
Hiroaki Sandoh
DC and AC Contingency Solvers in Composite Power System Adequacy Assessment
Øystein Stake Laengen and Vijay Venu Vadlamudi
Methodology for Quantified Risk Assessment
Jan-Erik Vinnem and Willy Røed
A Survey of Replacement Models with Minimal Repair
Mohamed-Salah Ouali, Lotfi Tadj, Soumaya Yacout and Daoud Ait-Kadi
Modelling of the Dynamic Train-Track-Substructure Interaction for Track Monitoring
Elias Kassa and Xiaopei Cai
Introduction: Software Dependability
Long Wang
Introduction
Jean-Pierre Signoret and Alain Leroy
Benefits of Digital Transformation for Maintenance Management Systems. Market Trends
Adolfo Crespo Márquez
Introduction
Srinivasan Gopalakrishnan, Massimo Ruzzene and Sathyanarayana Hanagud
Reliability Modelling of Complex Systems
Krzysztof Kołowrocki
Lifetime Data
M. Luz Gámiz, K. B. Kulasekera, Nikolaos Limnios and Bo Henry Lindqvist
Development of Physics-Based Modeling for ULSI Interconnections Failure Mechanisms: Electromigration and Stress-Induced Voiding
Cher Ming Tan, Zhenghao Gan, Wei Li and Yuejin Hou
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