Springer Series in Reliability Engineering

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Control Charts for Monitoring Time-Between-Events-and-Amplitude Data: Philippe Castagliola, Giovanni Celano, Dorra Rahali and Shu Wu
Mathematical Models for Reliability Allocation and Optimization for Complex Systems: Domenico Falcone, Alessandro Silvestri, Gianpaolo Bona and Antonio Forcina
Improving Switches and Crossings Performance and Reliability: Sin Sin Hsu and Niall Fagan
ATEX—Equipment Selection: Torben Jespen
Simulation of Near-Field Pulse-Like Ground Motion: Izuru Takewaki, Abbas Moustafa and Kohei Fujita
Cyclically Two Dimensional Stochastic Differential Equation Modeling: Yoshinobu Tamura and Shigeru Yamada
Internal Loads: T. Tinga
Selective Maintenance for Multi-state Systems Under Imperfect Maintenance: Yu Liu, Hong-Zhong Huang and Tao Jiang
Reliability Analysis for Warm Standby Systems with Two Different Spare Areas: Lirong Cui, Weixin Jiang and Mengqian Wang
Recycling of Noble Metals Used in Memory Packaging: Gan Chong Leong and Huang Chen-Yu
Random Inspection Models: Kodo Ito and Toshio Nakagawa
Materials Development for Future Datacenter Applications: Chong Leong Gan and Chen Yu Huang
Reliability Analysis for Mobile OSS: Shigeru Yamada and Yoshinobu Tamura
Modelling and Analysis of Degradation and Maintenance: D. N. P. Murthy and Nat Jack
Risks and Safety in Building Structures: Håkan Sundquist
Global Buckling Reliability Analysis of Slender Network Arch Bridges: An Application of Monte Carlo-Based Estimation by Optimized Fitting: Anders Rønnquist and Arvid Naess
Case Studies for System Reliability and Risk Assessment: Jong Gyun Choi, Hyun Gook Kang and Poong Hyun Seong
Basics of Stochastic Processes, Point and Marked Point Processes: Mauricio Sánchez-Silva and Georgia-Ann Klutke
AMP Primary Sources: David Lapesa Barrera
Innovation Environment in Europe—Efficiency Analysis Case Study: Viktor Prokop, Jan Stejskal, Petr Hájek and Michaela Kotková Stříteská
Renewal Processes: Toshio Nakagawa
Univariate and Multivariate Process Capability Analysis for Different Types of Specification Limits: Ashis Kumar Chakraborty and Moutushi Chatterjee
Reliability Analysis of Microgrid Systems Using Hybrid Approaches: Moushumi Patowary, Bimal C. Deka and Gayadhar Panda
Replacement Last Policies: Xufeng Zhao and Toshio Nakagawa
New Technologies for Maintenance: Jay Lee and Haixia Wang
Anomaly Detection for Catalyzing Operational Excellence in Complex Manufacturing Processes: A Survey and Perspective: Moussab Orabi, Kim Phuc Tran, Sébastien Thomassey and Philip Egger
Technological Management of Atomic-Multinology by Social Network Theory: Taeho Woo
Dynamic Risk Assessment of Fire-Induced Domino Effects: Chao Chen, Genserik Reniers and Ming Yang
Software Reliability Growth Models: P. K. Kapur, H. Pham, A. Gupta and P. C. Jha
Digital Transformation in Rail Transport—Key Challenges and Barriers: Marek Jabłoński
Moment Estimation-Based Method of Motion Accuracy Reliability Analysis for Industrial Robots: Dequan Zhang, Shuoshuo Shen and Xu Han
Multidimensional Spectra of Multistate Systems with Binary Components: Ilya Gertsbakh and Yoseph Shpungin
Fitting Phase-Type Distributions and Markovian Arrival Processes: Algorithms and Tools: Hiroyuki Okamura and Tadashi Dohi
Modelling, Simulation and Vulnerability Analysis of Interdependent Technical Infrastructures: Jonas Johansson and Henrik Hassel
General Methods for Performing Human Reliability and Error Analysis in Power Plants: B. S. Dhillon
Computational Tools of Media Analysis for Corporate Policy Effectiveness Evaluation: Models and Their Reliability: Gregory S. Khvatsky, Dmitry G. Zaytsev, Valentina V. Kuskova and Anna A. Sokol
Time Trends for Binomial and Poisson Data: Dana Kelly and Curtis Smith
A Role of Network Data Envelopment Analysis Approach in Manufacturing Industry: Review of Last 5 years: Atul Kumar and Millie Pant
Distribution Models: Renyan Jiang
Shocks and Degradation: Maxim Finkelstein and Ji Hwan Cha
Audio Driven Detection of Hate Speech in Telugu: Toward Ethical and Secure CPS: M. Santhosh Kumar, P. Sai Ravula, M. Prasanna Teja, J. Ajay Surya, V. Mohitha and G. Jyothish Lal
Engineering (Dynamic) Load Analysis: Seongwoo Woo
Reliability Analysis Tool for Embedded OSS: Shigeru Yamada and Yoshinobu Tamura
Modeling Complex Technical Systems Operation Processes: Krzysztof Kołowrocki and Joanna Soszyńska-Budny
LZ-Transform and Inverse LZ-Transform of a Discrete-State Continuous-Time Markov Process: Anatoly Lisnianski, Ilia Frenkel and Lev Khvatskin
Investigating Bad Smells with Feature Selection and Machine Learning Approaches: Aakanshi Gupta, Rashmi Gandhi and Vijay Kumar
Random Periodic Replacement Policies: Toshio Nakagawa
Robust Multi-Response Based Software Reliability Modeling: Anusha Pai, Gopalkrishna Joshi and Suraj Rane
Statistical Data Analysis: Chao Hu, Byeng D. Youn and Pingfeng Wang
An Analytical Model of the Value of Mergers and Acquisitions Employing Profit Flows with Synergies: Kimitoshi Sato, Kyoko Yagi and Katsushige Sawaki