Springer Series in Reliability Engineering

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DC and AC Contingency Solvers in Composite Power System Adequacy Assessment: Øystein Stake Laengen and Vijay Venu Vadlamudi
Introduction: Jan-Erik Vinnem and Willy Røed
Reliability of Electronic Components: Jong Gyun Choi and Poong Hyun Seong
Risk and Reliability Analysis: Paolo Gardoni
EU Legislation: Torben Jespen
Physics-Informed Machine Learning for Industrial Reliability and Safety Engineering: A Review and Perspective: Dac Hieu Nguyen, Thi Hien Nguyen, Kim Duc Tran and Kim Phuc Tran
Artificial Intelligence for Smart Manufacturing in Industry 5.0: Methods, Applications, and Challenges: Huu Du Nguyen and Kim Phuc Tran
Development of Physics-Based Modeling for ULSI Interconnections Failure Mechanisms: Electromigration and Stress-Induced Voiding: Cher Ming Tan, Zhenghao Gan, Wei Li and Yuejin Hou
Random Age Replacement Model: Satoshi Mizutani, Xufeng Zhao and Toshio Nakagawa
Intelligent Software Engineering for Reliable Cloud Operations: Michael R. Lyu and Yuxin Su
Fundamentals of Thermodynamics Applied to Thermal Power Plants: José R. Simões-Moreira
Safety Management Mechanisms in Rail Transport: Adam Jabłoński and Marek Jabłoński
Poisson Processes: Toshio Nakagawa
Smart Manufacturing and Industry 5.0: Adding the Human Edge to Industry 4.0: M. Orabi, S. Thomassey and K. P. Tran
Reflections on Risks and Technology: Lennart Sjöberg and Torbjörn Thedéen
System Reliability and Risk Analysis: Enrico Zio
Background: Jean-Pierre Signoret and Alain Leroy
Introduction to Bayesian Inference: Dana Kelly and Curtis Smith
Earthquake Resilience of High-Rise Buildings: Case Study of the 2011 Tohoku (Japan) Earthquake: Izuru Takewaki, Abbas Moustafa and Kohei Fujita
Application of Machine Learning in Statistical Process Control Charts: A Survey and Perspective: Phuong Hanh Tran, Adel Ahmadi Nadi, Thi Hien Nguyen, Kim Duc Tran and Kim Phuc Tran
ATEX—Workplace Legislation: Torben Jespen
Threat Landscape in Federated Learning: Kai Li, Xin Yuan and Wei Ni
Probability Models: Cao Wang
Preliminaries: Reliability and Point Processes: Ji Hwan Cha and Maxim Finkelstein
Basic Stochastics for Reliability Analysis: Maxim Finkelstein and Ji Hwan Cha
Essentials of Probability Theory: Mircea Grigoriu
System Reliability Concepts: Hoang Pham
Engineering Activities in Product Life Cycle: Renyan Jiang
Fundamentals of Probability Theory: Chao Hu, Byeng D. Youn and Pingfeng Wang
Condition-Based Maintenance: Cláudia Ferreira, Ana Silva, Jorge de Brito and Inês Flores-Colen
Dynamical Process of Gas Leakage: Kuibin Zhou
Stochastic Differential Equation Model for OSS Reliability Analysis: Yoshinobu Tamura and Shigeru Yamada
Exposing the Myth of Predictability: Asbjørn Rolstadås, Per Willy Hetland, George Farage Jergeas and Richard E. Westney
The Story of Airworthiness Approvals and Certifications: David Lapesa Barrera
The Story of Airworthiness Approvals and Certifications: David Lapesa Barrera
External Loads: T. Tinga
Dynamical Modeling of Economy in Global Nuclear Energy Market: Taeho Woo
Safety Management in Chemical Industrial Clusters: The State of the Art: Genserik Reniers and Yulia Pavlova
Defining Concepts and Categorizing Interdependencies: Jørn Vatn, Per Hokstad and Ingrid Bouwer Utne
A Review of New Digital Technologies Impacting Maintenance Management: Adolfo Crespo Márquez
Optimal Maintenance Policies for Power Equipment: George J. Anders
Improved Industrial Risk Analysis via a Human Factor-Driven Bayesian Network Approach: Silvia Carpitella, Joaquín Izquierdo, Martin Plajner and Jiří Vomlel
Basic Mathematical Concepts: B. S. Dhillon
Continuing Airworthiness Management—Organization and AMP Requirements: David Lapesa Barrera
Continuing Airworthiness Management—Organization and AMP Requirements: David Lapesa Barrera
Bayesian Inference for Common Aleatory Models: Dana Kelly and Curtis Smith
Rethinking Project Risk Management: Asbjørn Rolstadås, Per Willy Hetland, George Farage Jergeas and Richard E. Westney
Risk Characterization: Prabhakar V. Varde and Michael G. Pecht
Probability Theory: Ajit Kumar Verma, Srividya Ajit and Manoj Kumar
NHPP Model and AHP for OSS Reliability Analysis: Shigeru Yamada and Yoshinobu Tamura