Springer Series in Reliability Engineering

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An Overview: K. A. H. Kobbacy and D. N. P. Murthy
Reliability of a Network with Heterogeneous Components: Ilya B. Gertsbakh, Yoseph Shpungin and Radislav Vaisman
Introduction: Srinivasan Gopalakrishnan, Massimo Ruzzene and Sathyanarayana Hanagud
A Game of the Newsvendor Problem Between a Retailer and Customers Under the Space-Time Hotelling Model: Hiroaki Sandoh
Development of Physics-Based Modeling for ULSI Interconnections Failure Mechanisms: Electromigration and Stress-Induced Voiding: Cher Ming Tan, Zhenghao Gan, Wei Li and Yuejin Hou
EU Legislation: Torben Jespen
Physics-Informed Machine Learning for Industrial Reliability and Safety Engineering: A Review and Perspective: Dac Hieu Nguyen, Thi Hien Nguyen, Kim Duc Tran and Kim Phuc Tran
Artificial Intelligence for Smart Manufacturing in Industry 5.0: Methods, Applications, and Challenges: Huu Du Nguyen and Kim Phuc Tran
Fundamentals of Thermodynamics Applied to Thermal Power Plants: José R. Simões-Moreira
Earthquake Resilience of High-Rise Buildings: Case Study of the 2011 Tohoku (Japan) Earthquake: Izuru Takewaki, Abbas Moustafa and Kohei Fujita
Application of Machine Learning in Statistical Process Control Charts: A Survey and Perspective: Phuong Hanh Tran, Adel Ahmadi Nadi, Thi Hien Nguyen, Kim Duc Tran and Kim Phuc Tran
ATEX—Workplace Legislation: Torben Jespen
Introduction to Bayesian Inference: Dana Kelly and Curtis Smith
Background: Jean-Pierre Signoret and Alain Leroy
Poisson Processes: Toshio Nakagawa
Safety Management Mechanisms in Rail Transport: Adam Jabłoński and Marek Jabłoński
Intelligent Software Engineering for Reliable Cloud Operations: Michael R. Lyu and Yuxin Su
System Reliability and Risk Analysis: Enrico Zio
Reflections on Risks and Technology: Lennart Sjöberg and Torbjörn Thedéen
Smart Manufacturing and Industry 5.0: Adding the Human Edge to Industry 4.0: M. Orabi, S. Thomassey and K. P. Tran
Random Age Replacement Model: Satoshi Mizutani, Xufeng Zhao and Toshio Nakagawa
Threat Landscape in Federated Learning: Kai Li, Xin Yuan and Wei Ni
Preliminaries: Reliability and Point Processes: Ji Hwan Cha and Maxim Finkelstein
Probability Models: Cao Wang
Basic Stochastics for Reliability Analysis: Maxim Finkelstein and Ji Hwan Cha
System Reliability Concepts: Hoang Pham
Essentials of Probability Theory: Mircea Grigoriu
Fundamentals of Probability Theory: Chao Hu, Byeng D. Youn and Pingfeng Wang
The Story of Airworthiness Approvals and Certifications: David Lapesa Barrera
Exposing the Myth of Predictability: Asbjørn Rolstadås, Per Willy Hetland, George Farage Jergeas and Richard E. Westney
The Story of Airworthiness Approvals and Certifications: David Lapesa Barrera
Condition-Based Maintenance: Cláudia Ferreira, Ana Silva, Jorge de Brito and Inês Flores-Colen
External Loads: T. Tinga
Dynamical Modeling of Economy in Global Nuclear Energy Market: Taeho Woo
Engineering Activities in Product Life Cycle: Renyan Jiang
Stochastic Differential Equation Model for OSS Reliability Analysis: Yoshinobu Tamura and Shigeru Yamada
Dynamical Process of Gas Leakage: Kuibin Zhou
Basic Mathematical Concepts: B. S. Dhillon
Optimal Maintenance Policies for Power Equipment: George J. Anders
Improved Industrial Risk Analysis via a Human Factor-Driven Bayesian Network Approach: Silvia Carpitella, Joaquín Izquierdo, Martin Plajner and Jiří Vomlel
Defining Concepts and Categorizing Interdependencies: Jørn Vatn, Per Hokstad and Ingrid Bouwer Utne
A Review of New Digital Technologies Impacting Maintenance Management: Adolfo Crespo Márquez
Safety Management in Chemical Industrial Clusters: The State of the Art: Genserik Reniers and Yulia Pavlova
Continuing Airworthiness Management—Organization and AMP Requirements: David Lapesa Barrera
Continuing Airworthiness Management—Organization and AMP Requirements: David Lapesa Barrera
Risk Characterization: Prabhakar V. Varde and Michael G. Pecht
Bayesian Inference for Common Aleatory Models: Dana Kelly and Curtis Smith
Rethinking Project Risk Management: Asbjørn Rolstadås, Per Willy Hetland, George Farage Jergeas and Richard E. Westney
Probability Theory: Ajit Kumar Verma, Srividya Ajit and Manoj Kumar
NHPP Model and AHP for OSS Reliability Analysis: Shigeru Yamada and Yoshinobu Tamura