EconPapers    
Economics at your fingertips  
 

Materials Development for Future Datacenter Applications

Chong Leong Gan () and Chen Yu Huang ()
Additional contact information
Chong Leong Gan: Micron Memory Taiwan Co., Ltd.
Chen Yu Huang: Micron Memory Taiwan Co., Ltd.

Chapter Chapter 3 in Electronic Materials Innovations and Reliability in Advanced Memory Packaging, 2025, pp 45-80 from Springer

Abstract: Abstract What has been the most prominent and trending topic across global tech industries since 2022? The most fitting answer is likely ‘Generative Artificial IntelligenceGenerative Artificial Intelligence (GenAI)’ (GenAIGenerative Artificial Intelligence (GenAI)), which refers to artificial intelligence (AIArtificial Intelligence (AI)) systems created to produce new data or information that resembles human output. The rise of AIArtificial Intelligence (AI) has significantly impacted networks and computing data centers, driving the need for technical innovations to support future infrastructure improvements. Nearly all industry leaders and tech giants are actively seeking technology relevant to (1) high-speed, high-bandwidth data communications; (2) sustainable and reliable energy and cooling solutions, and (3) novel materials, to enhance various aspects of their businesses and boost their high-performance computing (HPCHigh Performance Computing (HPC)) capabilities, aiming towards the development of AIArtificial Intelligence (AI)-driven data centers.

Date: 2025
References: Add references at CitEc
Citations:

There are no downloads for this item, see the EconPapers FAQ for hints about obtaining it.

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:spr:ssrchp:978-3-031-94795-7_3

Ordering information: This item can be ordered from
http://www.springer.com/9783031947957

DOI: 10.1007/978-3-031-94795-7_3

Access Statistics for this chapter

More chapters in Springer Series in Reliability Engineering from Springer
Bibliographic data for series maintained by Sonal Shukla () and Springer Nature Abstracting and Indexing ().

 
Page updated 2025-07-22
Handle: RePEc:spr:ssrchp:978-3-031-94795-7_3