Introduction to Control Charts and Machine Learning for Anomaly Detection in Manufacturing

Kim Phuc Tran ()
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Kim Phuc Tran: University of Lille, ENSAIT, GEMTEX

A chapter in Control Charts and Machine Learning for Anomaly Detection in Manufacturing, 2022, pp 1-6 from Springer

Abstract: Abstract In this chapter, we provide an introduction to Anomaly Detection and potential applications in manufacturing using Control Charts and Machine Learning techniques. We elaborate on the peculiarities of process monitoring and Anomaly Detection with Control Charts and Machine Learning in the manufacturing process and especially in the smart manufacturing contexts. We present the main research directions in this area and summarize the structure and contribution of the book.

Date: 2022
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Persistent link: https://EconPapers.repec.org/RePEc:spr:ssrchp:978-3-030-83819-5_1

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DOI: 10.1007/978-3-030-83819-5_1

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