Electronic System Reliability

Ajit Kumar Verma (), Srividya Ajit () and Durga Rao Karanki ()
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Ajit Kumar Verma: Stord/Haugesund University College
Srividya Ajit: Stord/Haugesund University College
Durga Rao Karanki: Paul Scherrer Institute

Chapter Chapter 5 in Reliability and Safety Engineering, 2016, pp 161-182 from Springer

Abstract: Abstract The dominating failure mechanisms for various electronic components such as resistorsResistors , capacitorsCapacitors , relays, silicon devices, etc. and the corresponding failure modesFailure modes are briefly explained.

Keywords: Field Programmable Gate Array; Electronic Circuit; Negative Bias Temperature Instability; Process Multiplier; Zener Diode (search for similar items in EconPapers)
Date: 2016
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Persistent link: https://EconPapers.repec.org/RePEc:spr:ssrchp:978-1-4471-6269-8_5

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DOI: 10.1007/978-1-4471-6269-8_5

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