On the Reliability of Computing-in-Memory Accelerators for Deep Neural Networks

Zheyu Yan (), Xiaobo Sharon Hu () and Yiyu Shi ()
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Zheyu Yan: University of Notre Dame
Xiaobo Sharon Hu: University of Notre Dame
Yiyu Shi: University of Notre Dame

A chapter in System Dependability and Analytics, 2023, pp 167-190 from Springer

Abstract: Abstract Computing-in-memory with emerging non-volatile memory (nvCiM) is shown to be a promising candidate for accelerating deep neural networks (DNNs) with high energy efficiency. However, most non-volatile memory (NVM) devices suffer from reliability issues, resulting in a difference between actual data involved in the nvCiM computation and the weight value trained in the data center. Thus, models actually deployed on nvCiM platforms achieve lower accuracy than their counterparts trained on the conventional hardware (e.g., GPUs). In this chapter, we first offer a brief introduction to the opportunities and challenges of nvCiM DNN accelerators and then show the properties of different types of NVM devices. We then introduce the general architecture of nvCiM DNN accelerators. After that, we discuss the source of unreliability and how to efficiently model their impact. Finally, we introduce representative works that mitigate the impact of device variations.

Keywords: Compute-in-memory (CIM); Device variations; Deep neural networks (DNN) (search for similar items in EconPapers)
Date: 2023
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Persistent link: https://EconPapers.repec.org/RePEc:spr:ssrchp:978-3-031-02063-6_9

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DOI: 10.1007/978-3-031-02063-6_9

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