Research on Accelerated Test Method for Reliability of a Certain Refrigeration Device

Dayong Rui (), Cheng Sun and Yisheng Zhu
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Dayong Rui: The 723 Institute of China State Shipping Corporation
Cheng Sun: The 723 Institute of China State Shipping Corporation
Yisheng Zhu: The 723 Institute of China State Shipping Corporation

A chapter in Data-Driven Methods for Reliability and Safety Engineering: Applications in Industrial Systems, 2026, pp 531-540 from Springer

Abstract: Abstract The reliability accelerated test has been widely adopted for electronic equipment deployed on surface ships. This study presents a concise overview of the principles and procedures associated with reliability accelerated testing. For a specific refrigeration device, an accelerated test plan is developed, taking into account the operational characteristics of the equipment. The primary failure-inducing stresses identified are temperature stress and vibration stress. The acceleration of temperature stress is implemented using the Arrhenius acceleration model, while the vibration stress is addressed in accordance with the guidelines outlined in GJB150.16A-2009. Based on these methodologies, the acceleration factor is determined, and a corresponding acceleration test profile is established. The findings of this work offer a valuable engineering reference for the validation of performance indicators in electronic equipment requiring high reliability.

Keywords: Reliability accelerated test; Refrigeration device; Temperature stress; Vibration stress; Acceleration factor (search for similar items in EconPapers)
Date: 2026
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Persistent link: https://EconPapers.repec.org/RePEc:spr:ssrchp:978-3-032-22873-4_39

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DOI: 10.1007/978-3-032-22873-4_39

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