Physics-of-Failure Approach for Electronics

Prabhakar V. Varde () and Michael G. Pecht ()
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Prabhakar V. Varde: Bhabha Atomic Research Centre
Michael G. Pecht: University of Maryland

Chapter Chapter 12 in Risk-Based Engineering, 2018, pp 417-445 from Springer

Abstract: Abstract Physics-of-failure (PoF) approach is integral part of IRBE as in this approach reliability of the component and systems is predicted based on scientific models for identification of applicable failure mechanism and evaluation degradation to arrive at time to failure. The traditional statistical approach for reliability evaluation can predict the probability of failure but incapable of providing information on instant of failure. The physics-of-failure approach as part of prognostics framework can predict failure in advance with acceptable level of uncertainty. PoF as an approach is extensively being applied for electronics reliability; hence, this chapter deals with PoF approach to electronics.

Keywords: Printed Wiring Board Assembly; Solder Interconnects; Remaining Useful Life (RUL); Critical Failure Mechanism; Failure Cause (search for similar items in EconPapers)
Date: 2018
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Persistent link: https://EconPapers.repec.org/RePEc:spr:ssrchp:978-981-13-0090-5_12

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DOI: 10.1007/978-981-13-0090-5_12

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