A Characterization of the $M$-tests Under Nearly Integrated Nearly White Noise

Aidan Wardak and Sayar Karmakar
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Aidan Wardak: University of Florida
Sayar Karmakar: University of Florida

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Abstract: We derive the limiting distributions of the $M$-test family of unit root statistics in the nearly integrated nearly white noise (NINW) framework introduced by Nabeya and Perron (1994) in the case of an unknown linear time trend. In the case of known long run variance (LRV), the limiting distributions of the $M^{GLS}$ tests are contaminated by additional noise terms as a result of quasi differencing whereas these terms are less present in the $M^{OLS}$ limiting distributions, both of which display conservative properties under conventional critical values. Furthermore, we prove the Gaussian power envelope in the NINW model is asymptotically equivalent to the standard envelope of Elliott, Rothenberg, and Stock (1996), and that the oracle $M$-tests have inefficient power relative to this benchmark. We then derive the limiting distributions of the feasible statistics and show that the autoregressive estimate of the LRV commonly used overestimates the LRV, creating altered limiting distributions. Finally, finite sample simulations illustrate that, of the procedures considered, no uniformly satisfactory solution exists for handling a series with a large negative moving average coefficient.

Date: 2026-09
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