An Analysis of Top Trading Cycles in Two-Sided Matching Markets
Yeon-Koo Che and
Olivier Tercieux
No 2014, Cowles Foundation Discussion Papers from Cowles Foundation for Research in Economics, Yale University
Abstract:
We study top trading cycles in a two-sided matching environment (Abdulkadiroglu and Sonmez (2003)) under the assumption that individuals� preferences and objects� priorities are drawn iid uniformly. The distributions of agents� preferences and objects� priorities remaining after a given round of TTC depend nontrivially on the exact history of the algorithm up to that round (and so need not be uniform iid). Despite the nontrivial history-dependence of evolving economies, we show that the number of individuals/objects assigned at each round follows a simple Markov chain and we explicitly derive the transition probabilities.
Keywords: Random matching markets; Markov property (search for similar items in EconPapers)
JEL-codes: C70 D47 D61 D63 (search for similar items in EconPapers)
Pages: 16 pages
Date: 2015-07
New Economics Papers: this item is included in nep-gth
References: View references in EconPapers View complete reference list from CitEc
Citations:
Downloads: (external link)
https://cowles.yale.edu/sites/default/files/files/pub/d20/d2014.pdf (application/pdf)
Our link check indicates that this URL is bad, the error code is: 404 Not Found
Related works:
Working Paper: An Analysis of Top Trading Cycles in Two-Sided Matching Markets (2015) 
This item may be available elsewhere in EconPapers: Search for items with the same title.
Export reference: BibTeX
RIS (EndNote, ProCite, RefMan)
HTML/Text
Persistent link: https://EconPapers.repec.org/RePEc:cwl:cwldpp:2014
Ordering information: This working paper can be ordered from
Cowles Foundation, Yale University, Box 208281, New Haven, CT 06520-8281 USA
The price is None.
Access Statistics for this paper
More papers in Cowles Foundation Discussion Papers from Cowles Foundation for Research in Economics, Yale University Yale University, Box 208281, New Haven, CT 06520-8281 USA. Contact information at EDIRC.
Bibliographic data for series maintained by Brittany Ladd ().