National Patterns of Technology Accumulation: Use of Patent Statistics

Lionel Nesta and Parimal Patel

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Abstract: We use US Patent Statistics to depict national patterns of technology accumulation in Japan and EU countries. Two properties of country profiles are confirmed, namely, stability over time with a country and differentiation across countries. The main novelty introduced here is the combined analysis of overall technological advantage, performance in fast growing areas and impact. The results show that in many areas of technology in which EU countries have an overall relative advantage, their performance in the subfields of highest technological opportunity is weak. On the other hand, Japan seems to have a consistent level of performance both in aggregate and in fast growing areas.

Date: 2004
Note: View the original document on HAL open archive server: https://hal-sciencespo.archives-ouvertes.fr/hal-03610885
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Published in Handbook of quantitative science and technology research. The use of publication and patent statistics in studies of S&T systems, Kluwer Academic Publishers, pp.531 - 552, 2004, 9781402027024

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Working Paper: National Patterns of Technology Accumulation: Use of Patent Statistics (2004)
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