An Overview of Modified Semiparametric Memory Estimation Methods
Marie Busch and
Philipp Sibbertsen ()
Hannover Economic Papers (HEP) from Leibniz Universität Hannover, Wirtschaftswissenschaftliche Fakultät
Several modified estimation methods of the memory parameter have been introduced in the past years. They aim to decrease the upward bias of the memory parameter in cases of low frequency contaminations or an additive noise component, especially in situations with a short-memory process being contaminated. In this paper, we provide an overview and compare the performance of nine semiparametric estimation methods. Among them are two standard methods, four modified approaches to account for low frequency contaminations and three procedures developed for perturbed fractional processes. We conduct an extensive Monte Carlo study for a variety of parameter constellations and several DGPs. Furthermore, an empirical application of the log-absolute return series of the S&P 500 shows that the estimation results combined with a long-memory test indicate a spurious long-memory process.
Keywords: Spurious Long Memory; Semiparametric estimation; Low frequency contamination; Pertubation; Monte Carlo simulation (search for similar items in EconPapers)
JEL-codes: C13 C14 C22 (search for similar items in EconPapers)
New Economics Papers: this item is included in nep-ecm and nep-ets
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Journal Article: An Overview of Modified Semiparametric Memory Estimation Methods (2018)
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Persistent link: https://EconPapers.repec.org/RePEc:han:dpaper:dp-628
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