Applications of Likelihood-Based Methods for the Reliability Parameter of the Location and Scale Exponential Distribution

F.A. van der Duyn Schouten and S.K. Bar-Lev
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F.A. van der Duyn Schouten: Tilburg University, Center For Economic Research

No 2003-83, Discussion Paper from Tilburg University, Center for Economic Research

Keywords: testing; statistical methods; distribution; maximum likelihood; reliability (search for similar items in EconPapers)
Date: 2003
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