Applications of Likelihood-Based Methods for the Reliability Parameter of the Location and Scale Exponential Distribution

F.A. van der Duyn Schouten and S.K. Bar-Lev
Additional contact information
F.A. van der Duyn Schouten: Tilburg University, School of Economics and Management

Other publications TiSEM from Tilburg University, School of Economics and Management

Date: 2003
References: View complete reference list from CitEc
Citations:

Downloads: (external link)
https://repository.tilburguniversity.edu/bitstream ... 6d39e417510/download (application/pdf)

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:tiu:tiutis:06d6e3e7-9d77-468b-95f9-f6f24cf42182

Access Statistics for this paper

More papers in Other publications TiSEM from Tilburg University, School of Economics and Management
Bibliographic data for series maintained by Richard Broekman ().