Exploring the Tail of Patented Invention Value Distributions

Frederic M. Scherer, Dietmar Harhoff () and Katrin Vopel
Authors registered in the RePEc Author Service: Katrin Cremers ()

No 97-30, ZEW Discussion Papers from ZEW - Leibniz Centre for European Economic Research

Abstract: We explore the tail of patented invention value distributions by using value estimates obtained directly from patent holders. The paper focuses on those full-term German patents of the application year 1977 which were held by West German and U.S. residents. The most valuable patents in our data account for a large fraction of the cumulative value over all observations. Several tests are conducted to pin down more precisely the nature of the high-value tail distribution. Among the Pareto, Singh-Maddala and log normal distributions, the log normal appears to provide the best fit to our patented invention value data.

Keywords: Patents; Skew Distributions (search for similar items in EconPapers)
JEL-codes: O31 O34 (search for similar items in EconPapers)
Date: 1997
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Citations: View citations in EconPapers (20)

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Related works:
Working Paper: Exploring the Tail of Patented Invention Value Distributions (1997)
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Persistent link: https://EconPapers.repec.org/RePEc:zbw:zewdip:5132

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