A Bayesian semiparametric regression model for reliability data using effective age

Li Li and Timothy E. Hanson

Computational Statistics & Data Analysis, 2014, vol. 73, issue C, 177-188

Abstract: A new regression model for recurrent events from repairable systems is proposed. The effectiveness of each repair in Kijima models I and II is regressed on repair-specific covariates. By modeling effective age in a flexible way, the model allows a spectrum of heterogeneous repairs besides “good as new” and “good as old” repairs. The density for the baseline hazard is modeled nonparametrically with a tailfree process prior which is centered at Weibull and yet allows substantial data-driven deviations from the centering family. Linearity in the predictors is relaxed using a B-spline transformation. The method is illustrated using simulations as well as two real data analyses.

Keywords: Effective age; Repairable system; Tailfree process; Truncated data (search for similar items in EconPapers)
Date: 2014
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Citations: View citations in EconPapers (4)

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Persistent link: https://EconPapers.repec.org/RePEc:eee:csdana:v:73:y:2014:i:c:p:177-188

DOI: 10.1016/j.csda.2013.11.015

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