Modeling and analysis of software fault detectability and removability with time variant fault exposure ratio, fault removal efficiency, and change point

Subhashis Chatterjee, Ankur Shukla and Hoang Pham

Journal of Risk and Reliability, 2019, vol. 233, issue 2, 246-256

Abstract: Software reliability growth models have been proposed to assess and predict the reliability growth of software, remaining number of faults, and failure rate. In previous studies, software faults have been mainly categorized into two categories based on its severity in removal process: simple faults and hard faults. In reality, fault detectability is one of the crucial factors which can influence the reliability growth of software. The detectability of a software fault depends on how frequently the instructions containing faults are executed. However, fault removability of a software fault depends on fault removal efficiency of debugging team. The main motive of this article is to incorporate the fault detectability in software reliability assessment. Fault exposure ratio is an essential factor for software reliability modeling that controls the per-fault hazard rate. It is strongly dependent on fault detectability. In this article, the effect of fault detectability, fault removability, fault exposure ratio, and fault removal efficiency has been considered simultaneously in software reliability growth modeling. Moreover, a logistic fault exposure ratio has been introduced. The effect of change point is incorporated in the proposed software reliability growth model. Two illustrative examples with software testing data have been presented.

Keywords: Software reliability growth model; non-homogeneous Poisson process; fault detectability; per-fault hazard rate; fault exposure ratio; fault removal efficiency; change point (search for similar items in EconPapers)
Date: 2019
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Citations: View citations in EconPapers (3)

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Persistent link: https://EconPapers.repec.org/RePEc:sae:risrel:v:233:y:2019:i:2:p:246-256

DOI: 10.1177/1748006X18772930

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