Bayesian inference for a novel hierarchical accelerated degradation model considering the mechanism variation
Hongyu Wang,
Xiaobing Ma and
Yu Zhao
Journal of Risk and Reliability, 2020, vol. 234, issue 5, 708-720
Abstract:
For highly reliable products, accelerated thermal degradation tests are efficient to provide feedback on reliability information. In accelerated thermal degradation tests, the degradation data collected at the elevated temperatures are used to extrapolate the performance of products at the normal temperature. An important tool in such extrapolation is the Arrhenius model, in which the activation energy is generally assumed to be constant. However, in some practical accelerated thermal degradation tests of polymeric materials, a variation of the underlying degradation mechanism is induced when the temperature rises to a certain high level, resulting in a change in the activation energy. Motivated by this phenomenon, we propose a two-stage Arrhenius model. The two stages correspond to the lower and higher temperature ranges with different activation energies. Then, this new model is incorporated to the degradation model, yielding a novel hierarchical model for the accelerated thermal degradation test data from polymeric materials involving a mechanism variation. Furthermore, the Bayesian method is adopted for parameter inference, and the lifetime distribution is obtained subsequently. A practical example of polysiloxane rubbers demonstrates the effectiveness of the proposed model.
Keywords: Accelerated thermal degradation test; Bayesian method; mechanism variation; polymeric material; two-stage Arrhenius model (search for similar items in EconPapers)
Date: 2020
References: View references in EconPapers View complete reference list from CitEc
Citations: View citations in EconPapers (1)
Downloads: (external link)
https://journals.sagepub.com/doi/10.1177/1748006X20918784 (text/html)
Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.
Export reference: BibTeX
RIS (EndNote, ProCite, RefMan)
HTML/Text
Persistent link: https://EconPapers.repec.org/RePEc:sae:risrel:v:234:y:2020:i:5:p:708-720
DOI: 10.1177/1748006X20918784
Access Statistics for this article
More articles in Journal of Risk and Reliability
Bibliographic data for series maintained by SAGE Publications ().