 Preparation and properties of V2O5 thin films for energy-efficient selective-surface applicationsM. A. Sobhan, M. R. Islam and K. A. Khan Applied Energy, 1999, vol. 64, issue 1-4, 345-351 Abstract: Thin V2O5 films have been prepared by thermal evaporation onto glass substrates at a pressure of about 1.99x10-3 Pa. The temperature dependence of electrical measurements exhibits an anomaly in resistivity at a temperature around 329 K. Temperature co-efficient of resistance (TCR) studies show positive values, so indicating semi-metallic behaviour up to a temperature of 363 K and the negative thereafter so indicating semi-conducting behaviour. Thickness-dependent resistivity measurement follows the Fuchs-Sordheimer size-effect theory. X-ray diffraction studies show that the material is amorphous. Optical studies show the material is highly transparent both in the visible and infrared regions. The integrated value of Tlum and Tsol is high, so indicating that the material is a potential candidate for selective surface applications. Keywords: Integrated; transmittence; Selective; surface; Temperature; dependence; Thermal; evaporation; Vanadium; pentoxide (search for similar items in EconPapers) Downloads: (external link) Related works: Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text Persistent link: https://EconPapers.repec.org/RePEc:eee:appene:v:64:y:1999:i:1-4:p:345-351 Ordering information: This journal article can be ordered from Access Statistics for this article Applied Energy is currently edited by J. Yan More articles in Applied Energy from Elsevier |
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