Growth and characterization of lead sulfide films deposited on glass substrates

S.m Salim and O Hamid

Renewable Energy, 2001, vol. 24, issue 3, 575-580

Abstract: Lead sulfide (PbS) films have been deposited by chemical deposition on a glass substrate. Microstructure characterization was carried out by X-ray diffraction and scanning electron microscopy in order to determine the average crystallite size (15 nm) and study the surface morphologies of the as-deposited and heat-treated films. The PbS films obtained had p-type conductivity and low resisitivity (5 Ω cm). The carrier density, Hall mobility and mean free path of carriers in PbS films were in the range 2.5×1017 cm−3, 5 cm2/V s and 0.642 μm, respectively.

Keywords: Microstructure; Electrical properties; Film composition; Thermal stability (search for similar items in EconPapers)
Date: 2001
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Persistent link: https://EconPapers.repec.org/RePEc:eee:renene:v:24:y:2001:i:3:p:575-580

DOI: 10.1016/S0960-1481(01)00044-1

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