 Combined X-bar and CRL Charts for the Gamma ProcessC. Sim Computational Statistics, 2003, vol. 18, issue 3, 547-563 Abstract: This paper (i) discusses the combined $\bar x$ and conforming run length (CRL) charts under the assumption that the quality characteristic under study follows a Gamma(ν, γ, ß) distribution with known parameters ν, γ and ß, (ii) examines the performance of the combined $\bar x$ and CRL charts for the Exp(γ, ß) process, when its parameters γ and ß are unknown and must be estimated from preliminary samples taken during the trial period, and (iii) obtains the adjusted control limits of the combined $\bar x$ and CRL charts that have a specified in-control average run length value for samples taken from the Exp(γ, β) process with unknown parameters. Studies of the average run lengths reveal that the combined $\bar x$ and CRL charts outperform the Shewhart $\bar x$ chart with either asymmetric probability limits or 3-sigma control limits. Copyright Physica-Verlag 2003 Keywords: Synthetic chart; Monte Carlo simulation; Gamma distribution; Asymmetric control limits; Average run length (search for similar items in EconPapers) Downloads: (external link) Related works: Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text Persistent link: https://EconPapers.repec.org/RePEc:spr:compst:v:18:y:2003:i:3:p:547-563 Ordering information: This journal article can be ordered from DOI: 10.1007/BF03354616 Access Statistics for this article Computational Statistics is currently edited by Wataru Sakamoto, Ricardo Cao and Jürgen Symanzik More articles in Computational Statistics from Springer |
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