Explainable AI for domain experts: a post Hoc analysis of deep learning for defect classification of TFT–LCD panels

Minyoung Lee (), Joohyoung Jeon () and Hongchul Lee ()
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Minyoung Lee: Korea University
Joohyoung Jeon: Korea University
Hongchul Lee: Korea University

Journal of Intelligent Manufacturing, 2022, vol. 33, issue 6, No 11, 1747-1759

Abstract: Abstract The deep learning (DL) model has performed successfully in various fields, including manufacturing. DL models for defect image data analysis in the manufacturing field have been applied to multiple domains such as defect detection, classification, and localization. However, DL models require trade-offs in accuracy and interpretability. We use explainable artificial intelligence techniques to analyze the predicted results of the defect image classification model, which is considered as a “black-box” model, to produce human-understandable results. We visualize defects using layer-wise relevance propagation-based methods, fit the model into a decision tree, and convert prediction results into human-interpretable text. Our research complements the interpretation of prediction results for the classification model. The domain expert can obtain the reliability and explanatory ability for the defect classification of TFT–LCD panel data of the DL model through the results of the proposed analysis.

Keywords: Deep learning; Defect classification; Visualization; Explainable artificial intelligence (search for similar items in EconPapers)
Date: 2022
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Citations: View citations in EconPapers (3)

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DOI: 10.1007/s10845-021-01758-3

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