Correction: Natural language processing (NLP) and association rules (AR)-based knowledge extraction for intelligent fault analysis: a case study in semiconductor industry

Zhiqiang Wang (), Kenneth Ezukwoke (), Anis Hoayek (), Mireille Batton-Hubert () and Xavier Boucher ()
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Zhiqiang Wang: Léonard de Vinci Pôle Universitaire, Kenneth Ezukwoke
Kenneth Ezukwoke: Mines Saint-Étienne, Univ. Clermont Auvergne, CNRS UMR 6158 LIMOS
Anis Hoayek: Mines Saint-Étienne, Univ. Clermont Auvergne, CNRS UMR 6158 LIMOS
Mireille Batton-Hubert: Mines Saint-Étienne, Univ. Clermont Auvergne, CNRS UMR 6158 LIMOS
Xavier Boucher: Mines Saint-Étienne, Univ. Clermont Auvergne, CNRS UMR 6158 LIMOS

Journal of Intelligent Manufacturing, 2025, vol. 36, issue 1, No 20, 373-373

Date: 2025
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DOI: 10.1007/s10845-023-02310-1

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