Fault Removal Efficiency: A Key Driver in Software Reliability Growth Modeling

Umashankar Samal () and Ajay Kumar ()
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Umashankar Samal: ABV-IIITM
Ajay Kumar: ABV-IIITM

A chapter in Reliability Engineering for Industrial Processes, 2024, pp 95-106 from Springer

Abstract: Abstract In the contemporary landscape of software development, the significance of software reliability cannot be overstated. With the escalating complexity and widespread integration of software systems across diverse domains, ensuring their dependability has emerged as a paramount concern. Software reliability growth models (SRGMs) play a crucial role in assessing and improving the reliability of software systems. These models provide a quantitative framework for understanding the evolution of faults and predicting the reliability of software during its development lifecycle, and illuminate the consequential enhancement in overall reliability over time. Central to this exploration is the concept of fault removal efficiency (FRE), quantifying the proportion of bugs eradicated through meticulous reviews, inspections, and testing processes. As a critical determinant of software quality and process management, FRE provides developers with invaluable insights into testing efficacy and aids in predicting additional efforts required. The chapter explores some SRGMs that incorporate FRE, providing readers with a comprehensive insight into how FRE shapes the dynamics of the SRGM.

Keywords: Software reliability; Fault removal efficiency; Mean value function; Least square estimation (search for similar items in EconPapers)
Date: 2024
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Persistent link: https://EconPapers.repec.org/RePEc:spr:ssrchp:978-3-031-55048-5_7

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DOI: 10.1007/978-3-031-55048-5_7

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