Statistical Design of New Two-Stage Plans for Reliability Demonstration Testing

Sun-Keun Seo (skseo@dau.ac.kr) and Won Young Yun (wonyun@pusan.ac.kr)
Additional contact information
Sun-Keun Seo: Dong-A University
Won Young Yun: Pusan National University

A chapter in Reliability Analysis and Maintenance Optimization of Complex Systems, 2025, pp 329-344 from Springer

Abstract: Abstract Reliability demonstration tests (RDTs) to ensure a pre-specified reliability target with a stated confidence level are widely used in industry. A new two-stage RDT plan that is more efficient in terms of expected test duration and useful in practice than corresponding single-stage ones is proposed for Weibull and lognormal distributions, respectively. Accepting zero or one failure two-stage plans to minimize the expected test duration at various quality levels including a lifetime target are proposed and analyzed under Type I censoring and sample sizes designated. Numerical examples are studied to illustrate the proposed two-stage RDT plans.

Date: 2025
References: Add references at CitEc
Citations:

There are no downloads for this item, see the EconPapers FAQ for hints about obtaining it.

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:spr:ssrchp:978-3-031-70288-4_18

Ordering information: This item can be ordered from
http://www.springer.com/9783031702884

DOI: 10.1007/978-3-031-70288-4_18

Access Statistics for this chapter

More chapters in Springer Series in Reliability Engineering from Springer
Bibliographic data for series maintained by Sonal Shukla (sonal.shukla@springer.com) and Springer Nature Abstracting and Indexing (indexing@springernature.com).