Optimal ridge estimation in the restricted logistic semiparametric regression models using generalized cross-validation

Mahdi Roozbeh

Journal of Applied Statistics, 2026, vol. 53, issue 5, 874-893

Abstract: Binary logistic semiparametric regression analysis is a commonly used statistical technique when the dependent variable is dichotomous or binary. In this analysis, the relationship between the success probability and certain explanatory variables is assumed to have a linear form, while the relationship to other variables is unknown. Multicollinearity is a serious problem that arises when explanatory variables in logistic semiparametric regression are highly correlated. It is well known that the variance of the maximum likelihood estimator is inflated due to multicollinearity in the semiparametric logistic regression model. Therefore, a novel stochastic restricted iterative weighted ridge estimator for logistic semiparametric regression is introduced, and its statistical properties are extracted asymptotically. Moreover, an extension of the generalized cross validation (GCV) function is introduced and applied for choosing the best values of the ridge parameter and the bandwidth of the kernel smoother. Additionally, some theorems are developed to illustrate the convergence of the GCV mean. Ultimately, the Monte-Carlo simulation studies and an actual real-life data set are conducted to support our theoretical discussion, and the findings indicated that the new estimator outperformed the other estimators under consideration.

Date: 2026
References: Add references at CitEc
Citations:

Downloads: (external link)
http://hdl.handle.net/10.1080/02664763.2025.2541252 (text/html)
Access to full text is restricted to subscribers.

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:taf:japsta:v:53:y:2026:i:5:p:874-893

Ordering information: This journal article can be ordered from
http://www.tandfonline.com/pricing/journal/CJAS20

DOI: 10.1080/02664763.2025.2541252

Access Statistics for this article

Journal of Applied Statistics is currently edited by Robert Aykroyd

More articles in Journal of Applied Statistics from Taylor & Francis Journals
Bibliographic data for series maintained by Chris Longhurst ().