Optimal design of accelerated destructive degradation tests with block effects
Jiaxiang Cai and
Zhi-Sheng Ye
IISE Transactions, 2021, vol. 54, issue 1, 73-90
Abstract:
Accelerated Destructive Degradation Tests (ADDTs) are effective for reliability assessment of highly reliable products whose key performance characteristic has to be destructively measured. Test units in a reliability experiment typically share the same test environments, and this introduces block effects to the resulting ADDT data. Nevertheless, the block effects are seldom considered in the optimal design of an ADDT plan. Motivated by an application of a seal strength test, this study discusses methods for planning ADDT with block effects. In particular, two types of block effects are considered, i.e., the rig-layer blocking due to a shared test rig, and the gauge-layer blocking resulting from simultaneous measurements. The ADDT planning specifies the optimal stress levels and allocation of test units to these stress levels to minimize the asymptotic variance of the estimated lifetime quantiles at use conditions. The optimal test plans are investigated analytically and through a comprehensive numerical study. An application to the motivating example reveals the importance of considering the block effects in the test design.
Date: 2021
References: Add references at CitEc
Citations: View citations in EconPapers (8)
Downloads: (external link)
http://hdl.handle.net/10.1080/24725854.2020.1849875 (text/html)
Access to full text is restricted to subscribers.
Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.
Export reference: BibTeX
RIS (EndNote, ProCite, RefMan)
HTML/Text
Persistent link: https://EconPapers.repec.org/RePEc:taf:uiiexx:v:54:y:2021:i:1:p:73-90
Ordering information: This journal article can be ordered from
http://www.tandfonline.com/pricing/journal/uiie20
DOI: 10.1080/24725854.2020.1849875
Access Statistics for this article
IISE Transactions is currently edited by Jianjun Shi
More articles in IISE Transactions from Taylor & Francis Journals
Bibliographic data for series maintained by Chris Longhurst ().