Statistical Design of New Two-Stage Plans for Reliability Demonstration Testing

Sun-Keun Seo () and Won Young Yun ()
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Sun-Keun Seo: Dong-A University
Won Young Yun: Pusan National University

A chapter in Reliability Analysis and Maintenance Optimization of Complex Systems, 2025, pp 329-344 from Springer

Abstract: Abstract Reliability demonstration tests (RDTs) to ensure a pre-specified reliability target with a stated confidence level are widely used in industry. A new two-stage RDT plan that is more efficient in terms of expected test duration and useful in practice than corresponding single-stage ones is proposed for Weibull and lognormal distributions, respectively. Accepting zero or one failure two-stage plans to minimize the expected test duration at various quality levels including a lifetime target are proposed and analyzed under Type I censoring and sample sizes designated. Numerical examples are studied to illustrate the proposed two-stage RDT plans.

Date: 2025
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Persistent link: https://EconPapers.repec.org/RePEc:spr:ssrchp:978-3-031-70288-4_18

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DOI: 10.1007/978-3-031-70288-4_18

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