Le biais technologique: fondements, mesures et tests empiriques

Nathalie Greenan, Bouabdallah Khaled and Marie Claire Villeval
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Bouabdallah Khaled: GATE - Groupe d'analyse et de théorie économique - UL2 - Université Lumière - Lyon 2 - ENS LSH - Ecole Normale Supérieure Lettres et Sciences Humaines - CNRS - Centre National de la Recherche Scientifique

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Keywords: biais; technologique (search for similar items in EconPapers)
Date: 1999
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Published in Revue Française d'Economie, 1999, 14 (1), pp.171-227

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Journal Article: Le biais technologique fondements, mesures et tests empiriques (1999)
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Persistent link: https://EconPapers.repec.org/RePEc:hal:journl:halshs-00144027

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