Stochastics and Quality Control

2001 - 2026

Current editor(s): George P. Yanev

From De Gruyter
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Volume 27, issue 2, 2013

A Critical Review of Statistical Methods Used in Quality Control pp. 97-142

Sans Wolfgang

Estimation of Crossing Points of Continuous Distribution Functions pp. 143-176

Adam Kay and Ferger Dietmar

Transient Analysis of Multistage Degraded Systems with L Exponential Failure Modes and Partial Repair Times Modeled by Coxian-2 Distribution pp. 177-186

Moustafa Magdi S.

Control Charts for Doubly Truncated Binomial Distributions pp. 187-194

Chakraborty Ashit B. and Khurshid Anwer

A Class of Exponential-Type Estimators in Systematic Sampling pp. 195-208

Singh Housila P. and Jatwa Narendra K.

Volume 27, issue 1, 2012

A New Two-Parameter Lifetime Distribution with Increasing Failure Rate pp. 1-17

Shahsanaei Fatemeh, Rezaei Sadegh and Pak Abbas

Measuring E-Service Quality: Reviewing E-S-QUAL pp. 19-41

Yaya Luc Honore Petnji, Marimon Frederic and Fa Marti Casadesus

Statistical Tests Based on Reliability and Precision pp. 43-64

Weigand Christoph

Trend-Incomplete-Renewal Process Models for Repairable Systems pp. 65-83

Franz Jürgen and Pietzner Diana

Characterizations of Logistic Distribution Through Order Statistics with Independent Exponential Shifts pp. 85-96

Ahsanullah Mohammad, Yanev George P. and Onica Constantin

Volume 26, issue 2, 2011

A Nonparametric Control Chart for Location Based on Sub-Samples of Size Two pp. 91-98

Pandit Parameshwar V. and Math C. M.

Availability of a System with Multiple Failure Modes and Imperfect Repairs pp. 99-106

Nikolov Angel V.

Sampling Methods and Market Surveillance pp. 107-119

Sans Wolfgang

Control Charts for Controlling Variability of Non-Normal Processes pp. 121-131

Das Nandini

A Class of Weighted Gamma Distributions and its Properties pp. 133-144

Mahdy Mervat Mahdy Ramadan

Sequential Test for Truncated Distribution under Measurement Error pp. 145-153

Sayyed Mujahida and Singh J. R.

Exact Distribution of Argmax (Argmin) pp. 155-162

Habibi Reza

A Hybrid Economic Group Acceptance Sampling Plan for Exponential Lifetime Distribution pp. 163-171

Mughal Abdur Razzaque

Chain Sampling Inspection Plans Based on Bayesian Methodology pp. 173-187

Vijayaraghavan R. and Sakthivel K. M.

Exponentiated Modified Weibull Distribution pp. 189-200

Elbatal I.

Optimal Control of a Two-Item Inventory System with Different Types of Item Deterioration pp. 201-213

Alshamrani Ahmad and El-Gohary Awad

Testing Exponentiality Against NBUL Alternatives Using Positive and Negative Fractional Moments pp. 215-234

Anis M. Z.

Volume 26, issue 1, 2011

Editorial pp. 1-1

Elart von Collani

Control Charts Based on the g-and-h Distribution pp. 3-14

Nandini Das

Economic Reliability Group Acceptance Sampling Plans Based on the Inverse-Rayleigh and the Log-Logistic Distributions pp. 15-22

Aslam Muhammad and Mughal Abdur Razzaque

Use of Auxiliary Information in Estimating the Finite Population Mean in Survey Sampling pp. 23-39

Singh Housila P. and Bhayare Unnati

One-Sided Cumulative Sum (CUSUM) Control Charts for the Zero-Truncated Binomial Distribution pp. 41-51

Chakraborty Ashit B. and Khurshid Anwer

Significance Test for the Half Logistic Distribution pp. 53-62

Rao B. Srinivasa and Kantam R. R. L.

The Quality Loss Index QLI and Its Properties pp. 63-72

Hanagal David D. and Samajdwar Jagadiswar

Statistical Quality Control Limits for the Sample Mean Chart Using Robust Extreme Ranked Set Sampling pp. 73-89

Al-Omari Amer Ibrahim and Amjad Al-Nasser

Volume 25, issue 2, 2010

Editorial pp. 151-151

Elart von Collani

Acceptance Sampling Plans from Truncated Life Tests Based on the Log-Logistic Distributions for Percentiles pp. 153-167

Rao G. Srinivasa and Kantam R. R. L.

Book Review: Generalized Gaussian Error Calculus by Dr. rer. nat. Michael Grabe pp. 169-172

Elart von Collani

On the Robustness of Reliability Characteristic of Alpha-Distributed Lifetimes pp. 173-181

Khan Maroof A. and Islam H. M.

Binomial Poisson Distribution Revisited pp. 183-188

C.satheesh Kumar

Empirical Evaluation of Stochastikon Magister pp. 189-206

Zhai Xiaomin

Selection of Bayesian Double Sampling Inspection Plans by Attributes with Small Acceptance Numbers pp. 207-220

Vijayaraghavan R. and Sakthivel K. M.

Analysis of a Complex System Modelled by a Marked Point Process and Assuming Vacations for a Repairman pp. 221-242

Tiwari Nidhi and Singh Suraj Bhan

Optimal Replacement Policy Based on the Number of Down Times with Priority in Use pp. 243-251

Hanagal David D. and Kanade Rupali A.

Median Inactivity Time Function and its Reliability Properties pp. 253-268

Kandil Abd El-Fattah Mohamed, Kayid Mohamed and Mahdy Mervat Mahdy Ramadan

Statistical Inference on Software Reliability Assuming Exponential Fault Correction Time pp. 269-279

Harishchandra Kodialbail and Manjunatha Kammasandra M.

On Testing Exponentiality Against DMRL Alternatives pp. 281-299

Anis Mohammed Z.

Designing Single Sampling Plans by Variables Using Predictive Distribution pp. 301-316

Loganathan A., Vijayaraghavan R. and Rajagopal K.

Volume 25, issue 1, 2010

Editorial pp. 1-1

Elart von Collani

Optimal Replacement Policy Based on the Number of Down Times pp. 3-12

Hanagal David D. and Kanade Rupali A.

An L-Banded Approximation to the Inverse of Symmetric Toeplitz Matrices pp. 13-30

Benassi Romain, Pievatolo Antonio and Göb Rainer

Selection of Mixed Sampling Plans for Second Quality Lots pp. 31-42

Arul S. Deva and Joyce V. Jemmy

On New Perspectives for Statistical Computing in Business and Industry – A Solution with STATISTICA and R pp. 43-64

Weiß Christian H.

Reliability Analysis of k-out-of-n: G Repairable Shared Load Systems with Multiple Failures and Preventive Maintenance pp. 65-79

Vasanthi T. and Arulmozhi G.

Monitoring the Parameters of the Market Model by Linear Profile Procedures pp. 81-96

Ho Linda Lee, El Said Mahmoud and Kim Ricardo Wonseuk

An Addendum to the Estimators of Murthy–Sarma and Anis–Pandey of the Mean of the Normal Distribution pp. 97-107

Singh Housila P. and Sayyed Mujahida

A Bounded Intensity Process Reliability Growth Model in a Bayes-Decision Framework pp. 109-125

Srivastava Preeti Wanti and Jain Nidhi

Optimal Structure in Heterogeneous Multi-state Series-parallel Reliability Systems pp. 127-150

Sharma Vikas K., Agarwal Manju and Sen Kanwar