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Fiber Bundles

James U. Gleaton (), David Han (), James D. Lynch (), Hon Keung Tony Ng () and Fabrizio Ruggeri ()
Additional contact information
David Han: University of Texas at San Antonio, Management of Science and Statistics
James D. Lynch: University of South Carolina, Department of Statistics
Hon Keung Tony Ng: Bentley University, Department of Mathematical Sciences
Fabrizio Ruggeri: Consiglio Nazionale delle Ricerche, Istituto di Matematica Applicata e Tecnologie Informatiche

in Springer Books from Springer

Date: 2022
ISBN: 978-3-031-14797-5
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Chapters in this book:

Ch Chapter 1 Introduction and Preliminaries
James U. Gleaton, David Han, James D. Lynch, Hon Keung Tony Ng and Fabrizio Ruggeri
Ch Chapter 10 Simulated Size Effects Relationships Motivated by the Load-Sharing Cell Model
James U. Gleaton, David Han, James D. Lynch, Hon Keung Tony Ng and Fabrizio Ruggeri
Ch Chapter 11 Concluding Comments and Future Research Directions
James U. Gleaton, David Han, James D. Lynch, Hon Keung Tony Ng and Fabrizio Ruggeri
Ch Chapter 2 Electrical Circuits of Ordinary Capacitors
James U. Gleaton, David Han, James D. Lynch, Hon Keung Tony Ng and Fabrizio Ruggeri
Ch Chapter 3 Breakdown of Thin-Film Dielectrics
James U. Gleaton, David Han, James D. Lynch, Hon Keung Tony Ng and Fabrizio Ruggeri
Ch Chapter 4 Cell Models for Dielectrics
James U. Gleaton, David Han, James D. Lynch, Hon Keung Tony Ng and Fabrizio Ruggeri
Ch Chapter 5 Electrical Breakdown and the Breakdown Formalism
James U. Gleaton, David Han, James D. Lynch, Hon Keung Tony Ng and Fabrizio Ruggeri
Ch Chapter 6 Statistical Properties of a Load-Sharing Bundle
James U. Gleaton, David Han, James D. Lynch, Hon Keung Tony Ng and Fabrizio Ruggeri
Ch Chapter 7 An Illustrative Application: Fibers and Fibrous Composites
James U. Gleaton, David Han, James D. Lynch, Hon Keung Tony Ng and Fabrizio Ruggeri
Ch Chapter 8 Statistical Analysis of Time-to-Breakdown Data
James U. Gleaton, David Han, James D. Lynch, Hon Keung Tony Ng and Fabrizio Ruggeri
Ch Chapter 9 Circuits of Ordinary Capacitors
James U. Gleaton, David Han, James D. Lynch, Hon Keung Tony Ng and Fabrizio Ruggeri

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DOI: 10.1007/978-3-031-14797-5

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